Anti-radiation D latch based on dual interlocking unit

Abstract

An anti-radiation D latch based on a dual interlocking unit belongs to the anti-nuclear reinforcement field in the reliability of an integrated circuit. Problems that a traditional anti-radiation D latch needs more hardware; power consumption is high; delay time is long; although anti-dual-node flip can be realized, the capability of the anti-dual-node flip is poor; and even the fault tolerance ofthe dual-node flip can not be realized are solved. The latch comprises NMOS transistors N1 to N18, PMOS transistors P1 to P18 and one inverter I1. The amount of the required devices is less so that the power consumption of the whole latch is reduced, and the hardware cost is low. A signal at the input end of the latch can be transmitted to an output port only through a transmission gate, and datatransmission time is short. The fault tolerance of any single node and dual node flip can be realized so as to realize fault tolerance protection against single node and dual node flip. The latch canprotect the application of an integrated circuit chip in a high radiation environment (such as aerospace, a ground nuclear power plant and the like).

Description

technical field [0001] The invention belongs to the field of anti-radiation reinforcement in integrated circuit reliability. Background technique [0002] The traditional anti-radiation D-latch has been used for anti-radiation protection, but with the advancement of integrated circuit technology, the flipping of two nodes has become possible, so a new design is required to strengthen the protection of the two nodes. Although the traditional anti-irradiation D latch can realize anti-double-node flipping, it has poor ability to resist double-node flipping, and even cannot realize fault tolerance to double-node flipping, and there are many hardware required, high power consumption, and long transmission time. Therefore, the above problems urgently need to be solved. Contents of the invention [0003] The present invention aims to solve the problem that the traditional anti-radiation D latch needs more hardware, high power consumption, long delay time, and although it can rea...

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Problems solved by technology

[0003] The present invention aims to solve the problem that the traditional anti-radiation D latch needs more hardware, high power consumption, long delay time, and although it can realize anti-double-node flipping, it has poor anti-dual-node flipping ability, and even cannot realize double-node flipping. The fault-tolerant problem of node flipping, the present invention provides a kind of anti-irradiation D latch based on double interlocking unit

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