Anti-radiation D latch based on dual interlocking structure

Abstract

An anti-radiation D latch based on a dual interlocking structure belongs to the anti-nuclear reinforcement field in the reliability of an integrated circuit. Problems that a traditional anti-radiationD latch needs more hardware; power consumption is high; delay time is long; although anti-dual-node flip can be realized, the capability of the anti-dual-node flip is poor; and even the fault tolerance of the dual-node flip can not be realized are solved. The latch comprises NMOS transistors N1 to N19, PMOS transistors P1 to P19 and one inverter I1. The amount of the required devices is less andthe structure is simple so that the power consumption of the whole latch is reduced, and the hardware cost is low. A signal at the input end of the latch can be transmitted to an output port only through a transmission gate, and data transmission time is short. The fault tolerance of any single node and dual node flip can be realized so as to realize fault tolerance protection against single nodeand dual node flip. The latch can protect the application of an integrated circuit chip in a high radiation environment (such as aerospace, a ground nuclear power plant and the like).

Description

technical field [0001] The invention belongs to the field of anti-radiation reinforcement in integrated circuit reliability. Background technique [0002] In aerospace and high-radiation applications on the ground, the D latch needs to be hardened against radiation, mainly to prevent the stored data from being changed by external radiation particles. The traditional anti-radiation D latch is generally reinforced by triple-mode redundancy. The disadvantages are that it requires more hardware (up to 102 transistors), high power consumption, long delay time, and although it can achieve anti-double node flipping, However, the ability to resist double-node flipping is poor, and it is even impossible to achieve fault tolerance to double-node flipping. Therefore, the above problems need to be solved urgently. Contents of the invention [0003] The present invention aims to solve the problem that the traditional anti-radiation D latch needs more hardware, high power consumption,...

AI Technical Summary

Problems solved by technology

[0003] The present invention aims to solve the problem that the traditional anti-irradiation D latch requires more hardware, high power consumption, long delay time, and although it can realize anti-double-node flipping, it has poor anti-dual-node flipping ability, and even cannot realize double-node flipping. The problem of fault tolerance of node flipping, the present invention provides a kind of anti-radiation D latch based on double interlock structure

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