Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A Multilayer Model Monitoring Method for Process Industry Process

A multi-layer model, process industry technology, applied in the direction of program control, electrical program control, comprehensive factory control, etc., can solve the problems of inability to show the process production process, estimate losses, take remedial measures for a long time, economic and energy losses, etc. question

Active Publication Date: 2019-06-21
JIANGNAN UNIV +2
View PDF9 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Existing data monitoring is only limited to monitoring process parameters, and cannot show the production process in the process industry from a macroscopic and multi-level perspective, which makes it take a long time to find problems, estimate losses, and take remedial measures, and cannot stop losses in time. cause more serious economic and energy losses

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A Multilayer Model Monitoring Method for Process Industry Process
  • A Multilayer Model Monitoring Method for Process Industry Process
  • A Multilayer Model Monitoring Method for Process Industry Process

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0044]The following will take the crude oil processing process as an example to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without making creative efforts belong to the protection scope of the present invention.

[0045] This embodiment is divided into three parts. The first part is divided into multi-layer structures such as equipment layer, operation unit layer, device layer, and factory layer. The second part is the offline mode classification. The third part is online mode monitoring.

[0046] Block diagram of the present invention's implementation steps as figure 1 As shown, the specific implementation steps and algorithms are as follows:

[0047] Step 1: Taking the industrial process of crud...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A multi-layer mode monitoring method for a flow industrial process, relating to the field of industrial protraction and processing. The method comprises: dividing an industrial process into multiple layer levels from the perspective of mode; selecting different key performance indicators for the layer levels; acquiring operation data related to the key performance indicators; identifying the modes of all the layer levels; proposing a mode monitoring method for each layer level on the basis of a data-driven method, thereby achieving mode monitoring in a flow industrial process. The effect of quick fault discovery is achieved by monitoring real-time data in the modes of the layers identified in a clustering plane, and the effect of fault clearing is achieved on the basis of the selected N variables having the greatest influence on the current mode in combination with an expert system and an inference engine. In addition, the energy consumption of the process is reduced, and operation costs are optimized, and the competitiveness of products is improved.

Description

technical field [0001] The invention relates to a multi-layer mode monitoring method for process industrial processes, belonging to the field of industrial production and processing. Background technique [0002] Process safety, product quality, energy saving, emission reduction and efficiency enhancement are the core goals of the modern process industry, so real-time monitoring of the operating status of the process has great practical significance and value. With the expansion of the scale of process equipment in the modern process industry, the increase in process complexity, the safety of process operation and the market's requirements for product customization, it is more urgent to monitor the process operation of complex process industries. Conventional parameter control methods based on process measurement variables (such as temperature, pressure, liquid level, flow, composition, etc.) are to control one or more process parameters within a certain range in a single-fa...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G05B19/418
CPCG05B19/4185G05B2219/31088G05B23/0272G06Q10/0639
Inventor 栾小丽郑年年冯恩波刘成林刘飞
Owner JIANGNAN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com