Preparation method of in-situ electrifying type indium arsenide/gallium antimonide superlattice semiconductor sample of transmission electron microscope
A transmission electron microscope sample and transmission electron microscope technology, applied in the preparation of test samples, etc., can solve the problems of low hardness and high difficulty in preparation of transmission electron microscope samples, and achieve the effect of huge application potential
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[0027] (1) Preparation of high temperature curing conductive silver glue
[0028] First, take the resin (Resin) and the curing agent (Hardender) in the commercial high-temperature curing glue, and mix them well at room temperature according to the ratio of 10:1~9:1; take an appropriate amount of commercial conductive silver glue according to the size of the sample, and mix with A small amount of high-temperature curing adhesive should be fully mixed according to the ratio of 3:1~3:2 for further use. It is worth noting that the prepared high-temperature curing conductive silver adhesive should be used as soon as possible, and should not exceed 24 hours at room temperature.
[0029] (2) TEM sample preparation of superlattice semiconductors
[0030] First, use a diamond knife to cut the bulk material into strips with a width of about 4-5 mm along the cleavage plane of the gallium antimonide substrate on which the superlattice semiconductor bulk material is grown, and then use a d...
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