Preparation method for heterogeneous SiGe-based plasma pin diode string used for sleeve antenna
A technology of diode strings and sleeve antennas, which is applied in antennas, semiconductor/solid-state device manufacturing, semiconductor devices, etc., can solve problems such as large injection dose and energy, low integration, and poor controllability of solid-state plasma concentration and distribution. Achieve the effect of increasing breakdown voltage, increasing injection efficiency and current
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Embodiment 1
[0057] See figure 1 , figure 1 It is a structural schematic diagram of a reconfigurable sleeve antenna according to an embodiment of the present invention; the plasma pin diode string is used to make a sleeve antenna, such as figure 1 As shown, the sleeve antenna includes: a semiconductor substrate (1), a pin diode antenna arm (2), a first pin diode sleeve (3), a second pin diode sleeve (4), a coaxial feeder (5 ), DC bias lines (9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19);
[0058] See figure 2 , figure 2 It is a flow chart of a preparation method of a heterogeneous SiGe-based plasmonic pin diode according to an embodiment of the present invention; the preparation method includes steps:
[0059] (a) Select a SiGeOI substrate with a certain crystal orientation;
[0060] Among them, for step (a), the reason for using SiGeOI substrate is that solid-state plasma antennas require good microwave characteristics, and solid-state plasma pin diodes need to have good isolation cha...
Embodiment 2
[0107] See Figure 5a-Figure 5r , Figure 5a-Figure 5r It is a schematic diagram of the preparation method of another heterogeneous SiGe-based plasmonic pin diode according to the embodiment of the present invention; Taking a diode as an example to describe in detail, the specific steps are as follows:
[0108] Step 1, substrate material preparation steps:
[0109] (1a) if Figure 5a As shown, the SiGeOI substrate 101 with (100) orientation is selected, the doping type is p-type, and the doping concentration is 10 14 cm -3 , the thickness of the top layer SiGe is 50 μm;
[0110] (1b) if Figure 5b As shown, the method of chemical vapor deposition (Chemical vapor deposition, referred to as CVD) is used to deposit a layer of first SiO with a thickness of 40 nm on the SiGe layer. 2 layer 201;
[0111] (1c) Deposit a layer of first Si with a thickness of 2 μm on the substrate by chemical vapor deposition. 3 N 4 / SiN layer 202;
[0112] Step 2, isolation preparation ste...
Embodiment 3
[0138] Please refer to Figure 6 , Figure 6 It is a schematic structural diagram of another heterogeneous SiGe-based plasmonic pin diode according to an embodiment of the present invention. The heterogeneous SiGe-based plasmonic pin diode employs the above-mentioned as figure 2The preparation method shown is made, specifically, the SiGe-based plasma pin diode is prepared and formed on the SiGeOI substrate 301, and the P region 304, the N region 305 of the pin diode and the lateral direction are located between the P region 304 and the N region 305 The I-regions between them are located in the top layer SiGe302 of the substrate. Wherein, the pin diode can be isolated by STI deep trenches, that is, an isolation trench 303 is provided outside the P region 304 and the N region 305, and the depth of the isolation trench 303 is greater than or equal to the thickness of the top SiGe layer.
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