High reliability smd LED packaging structure

A packaging structure and reliability technology, applied in the field of electronics, can solve problems such as crack failure, difficult performance requirements, and cracks in the ceramic layer, and achieve the effects of improving wettability, solving heat dissipation problems, and improving reliability

Active Publication Date: 2016-01-13
上海晶擎能源科技有限公司
View PDF7 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

With the development of optical and / or electronic devices, their performance requirements are becoming more and more stringent, such as the need to further improve the integration of integrated circuits, the need to improve the luminous efficiency of LEDs, etc., so that the ceramic intermediate layer The performance requirements are also getting higher and higher. For example, as a ceramic intermediate layer, it not only needs to have high thermal conductivity and electrical insulation rate, but also needs to have high voltage breakdown strength, and also needs to have fluorescence characteristics; these properties require a single ceramic function. Layers are often difficult to achieve, and studies have also shown that it is difficult to meet all requirements through composite ceramic coatings, and composite ceramic coatings often have large differences in thermal expansion coefficients of various components, and the internal heat produced by repeated cycles of different temperatures Stress can cause cracks in the ceramic layer and even lead to fracture failure

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • High reliability smd LED packaging structure

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0022] The high-reliability SMD LED packaging structure described in this embodiment includes a metal base 10, and a voltage-resistant ceramic layer 20 is formed on the metal base, and a metal circuit layer 30 and a high-voltage ceramic layer are formed on the voltage-resistant ceramic layer 20. A thermally conductive ceramic layer 40 ; and an SMD LED lamp bead 50 is arranged on the metal circuit layer 30 and the high thermally conductive ceramic layer 40 . The metal matrix can be metal matrixes such as Al, Cu, Ag and Ni or their alloy matrix; the metal circuit layer is formed by dry etching through a deposited conductive metal layer, and the conductive metal is usually preferably Cu, Ag, Al or their alloy materials. The thickness of the high thermal conductivity ceramic layer is 10-500um; and the high thermal conductivity ceramic layer is preferably AlN, and is formed by a known sintering method. The high thermal conductivity ceramic layer and the pressure-resistant ceramic ...

Embodiment 2

[0024] The high-reliability SMD LED packaging structure described in this embodiment includes a metal base 10, and a voltage-resistant ceramic layer 20 is formed on the metal base, and a metal circuit layer 30 and a high-voltage ceramic layer are formed on the voltage-resistant ceramic layer 20. A thermally conductive ceramic layer 40 ; and an SMD LED lamp bead 50 is arranged on the metal circuit layer 30 and the high thermally conductive ceramic layer 40 . The metal substrate can be aluminum or aluminum alloy substrate; the metal circuit layer is formed by dry etching through the deposited conductive metal layer, and the conductive metal is usually preferably Cu, Ag, Al or their alloy materials . The thickness of the high thermal conductivity ceramic layer is 10-500um; and the high thermal conductivity ceramic layer is preferably AlN, and is formed by a known sintering method. The high thermal conductivity ceramic layer and the pressure-resistant ceramic layer are bonded by ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The present invention relates to a high reliability SMD? The LED packaging structure includes a metal base, and a pressure-resistant ceramic layer is formed on the metal base, and a metal circuit layer and a high thermal conductivity ceramic layer are formed on the pressure-resistant ceramic layer; and on the metal circuit layer and high SMD is provided on the thermally conductive ceramic layer? LED? Lamp beads. The high reliability SMD described in the present invention? In the LED packaging structure, the thermal conductivity of the high thermal conductivity ceramic layer is greater than 50? W / mK,? Lateral and radial heat conduction can be realized, and the voltage-resistant ceramic layer has high voltage-resistant breakdown performance.

Description

technical field [0001] The invention belongs to the field of electronic technology, and more specifically, the invention relates to a high-reliability SMD LED packaging structure for optical devices. Background technique [0002] Devices used in optics and / or electronics, such as integrated circuits or laser diodes, require the use of thermally conductive materials for heat transfer. For this purpose, a metallic base body is used, for example a copper base body, and an electrical isolation is often required between the optical and / or electronic components and the metal base body. And some ceramic materials have higher heat transfer efficiency and are electrically insulating. For this purpose, highly thermally conductive ceramic materials are frequently used as intermediate materials for providing electrical isolation while still maintaining thermal conductivity between the optical and / or electronic components and the metal base body. In order to provide efficient heat tran...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): H01L33/62H01L33/64
Inventor 高鞠
Owner 上海晶擎能源科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products