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Core shell structure nanowire tunneling field effect device

A tunneling field effect, core-shell structure technology, applied in nanotechnology, nanotechnology, semiconductor devices, etc., can solve the problem of driving current loss, etc., to improve the switching current ratio, reduce the off-state current, and reduce static power consumption Effect

Inactive Publication Date: 2013-03-13
PEKING UNIV SHENZHEN GRADUATE SCHOOL
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

But for the nanowire device itself, in order to suppress its short channel effect, the channel radius must be reduced, which will cause the loss of driving current

Method used

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  • Core shell structure nanowire tunneling field effect device
  • Core shell structure nanowire tunneling field effect device
  • Core shell structure nanowire tunneling field effect device

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Embodiment Construction

[0037] see figure 1 As shown, in a preferred embodiment of the present invention, the central region of the core-shell structure nanowire tunneling field effect device is composed of the shell 2 in the core-shell structure and the core 3 in the core-shell structure, and the two ends of the central region are respectively set The active region 1, the drain region 4, and the periphery of the central region are covered with silicon oxide 5 and gate electrode 6 in sequence. The core-shell structure and the components of the whole device are coaxially symmetrical.

[0038] Implementation mode: the two ends of the central region are the source region 1 and the drain region 4 of the same basic material; wherein: the source region 1 is a P-type heavily doped silicon material, the drain region 4 is an N-type heavily doped silicon material, and the shell 2 It is an N-type lightly doped silicon material, and the core 3 is silicon oxide.

[0039] In this embodiment, in the sub-threshold...

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Abstract

The invention relates to a core shell structure nanowire tunneling field effect device which comprises a gate electrode (6), a source region (1), a drain region (4), a central region and a gate dielectric layer (5), wherein the central region is in a coaxially symmetrical core shell structure; the core in the core shell structure is made of an insulator material; the shell in the core shell structure is made of a semiconductor material; the gate dielectric layer is completely sleeved into the central region and is used for electrically isolating the central region and the gate electrode; the gate electrode is completely sleeved into the dielectric layer; the grate electrode (6), the gate dielectric layer (5) and the central region are equal in length; and the source region and the drain region are respectively arranged at two sides of the central region. A field effect transistor has low leakage current, high grid-control capability and low subthreshold slope, and the drain induced barrier lowing and the short-channel effect are effectively suppressed, so that various nonideal effects of a ring gate nanowire tunneling field effect device in the size reducing process are reduced, and the comprehensive performance of the device is improved.

Description

technical field [0001] The invention relates to a semiconductor integrated circuit device, in particular to a core-shell structure nanowire tunneling field effect device. Background technique [0002] In the process of continuously reducing the size of traditional field effect devices according to Moore's law, they encounter bottlenecks such as short channel effects and increased gate currents, which limit their further development. Many new device concepts and structures have been proposed, such as tunneling field-effect transistors, silicon-on-insulator devices, double-gate devices, triple-gate devices, and gate-around nanowire devices. Among them, the tunneling field effect transistor can provide excellent subthreshold characteristics and extremely low off-state current due to its unique working mechanism; the gate-around nanowire device can provide high switching current ratio due to its excellent gate control ability. , is less affected by the short-channel effect and ...

Claims

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Application Information

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IPC IPC(8): H01L29/786H01L29/775H01L29/06B82Y10/00
Inventor 何进张湘煜张爱喜杜彩霞朱小安
Owner PEKING UNIV SHENZHEN GRADUATE SCHOOL
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