Infrared image processing method and infrared image processing device

Abstract

An embodiment of the invention discloses an infrared image processing method and an infrared image processing device. Based on data which are generated by calibrating a low-temperature black body and a high-temperature black body and used for non-uniform correction, the infrared image processing method includes the steps: normal-temperature black body imaging, offset correction, target imaging, blind pixel replacement, non-uniform correction, infrared image output and temperature judgment. A first calibrated offset and a first calibrated gain coefficient are corrected again by means of two-point correction and one-point correction for infrared images of a normal-temperature black body, and the corrected parameters are used for non-uniform correction, so that infrared image quality is effectively improved, infrared non-uniformity is reduced, the method is high in adaptability, and the device is fine in portability.

Description

technical field [0001] The invention relates to the technical field of infrared thermal image processing, in particular to an infrared image processing method and device. Background technique [0002] At present, infrared image processing technology has been widely used in many fields such as military, medical treatment, fire protection, security, transportation, electric power, construction, electronic manufacturing and petrochemical metallurgy. Under ideal conditions, the corresponding infrared system is uniformly irradiated by the infrared focal plane array, and the output amplitude should be exactly the same. But in fact, due to the inhomogeneity of the semiconductor material used to make the device (impurity concentration, crystal defects, and inhomogeneity of the internal structure, etc.), mask errors, defects, process conditions, and the use environment, the output amplitude is not the same. This is the non-uniformity of the infrared focal plane array response. [0...

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Problems solved by technology

[0005] Although there are many non-uniformity correction algorithms for thermal imaging, no algorithm with strong adaptability has been found so far. Various non-uniformity correction algorithms have their shortcomings. For example, the one-point correction method can only Correct the output signal of the unit at the same place. As the offset relative to this calibration point increases, the correction error will increase due to the inconsistency of the responsivity of each detector element, and the correction accuracy will be low. Two-point calibration It is difficult to select the second calibration point of the method, and the adaptability is poor. When the infrared sensor works for a long time or the ambient temperature changes, the non-uniformity of the focal plane array also drifts, and the infrared image correction effect gradually deteriorates.

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