Parasitic vertical PNP and manufacturing process thereof in BiCMOS process
A process, N-type technology, used in semiconductor/solid-state device manufacturing, electrical components, transistors, etc., can solve the problems of inability to meet chip integration requirements, low cut-off frequency, long transit time, etc., to eliminate adverse effects, improve Effect of Amplification Factor and Cutoff Frequency
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[0015] combine Figure 7 , the embodiment of the present invention includes the following steps:
[0016] Such as figure 1 As shown, firstly, ion implantation of the buried layer is performed on the P-type substrate as the buried layer, N-type epitaxial growth and the formation of the active region.
[0017] Secondly, if figure 2 As shown, ion implantation is carried out in the sinking connection layer. This layer is used as the vertical NPN collector and the parasitic lateral PNP base lead-out region in the BiCMOS process to connect with the outside world, and in the present invention as the base lead-out region of the vertical PNP.
[0018] Then, if image 3 As shown, the CMOS P-well isolation ion implantation is performed while the vertical PNP region is opened for implantation, thereby forming a vertical PNP collector. The ion implantation depth penetrates the field oxide layer and the N-type epitaxial layer. At this time, the implanted ions are B, the energy is 400k...
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