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Defect-containing silicon carbide biscuit as well as preparation method and nondestructive testing method thereof

A technology of silicon carbide and silicon carbide blanks, applied in the field of silicon carbide blanks and its preparation, can solve the problems that internal defects of silicon carbide blanks cannot be prefabricated, etc., and achieve the effect of simple operation and strong operability

Pending Publication Date: 2022-04-15
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In view of this, the present invention proposes a method for preparing a silicon carbide green body containing defects, so as to solve the technical problem that the internal defects of the silicon carbide green body cannot be prefabricated in the prior art

Method used

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  • Defect-containing silicon carbide biscuit as well as preparation method and nondestructive testing method thereof
  • Defect-containing silicon carbide biscuit as well as preparation method and nondestructive testing method thereof
  • Defect-containing silicon carbide biscuit as well as preparation method and nondestructive testing method thereof

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preparation example Construction

[0024] The embodiment of the present application provides a method for preparing a silicon carbide biscuit containing defects, comprising the following steps:

[0025] S1, adding solid organic matter in the process of preparing the silicon carbide green body, and performing molding;

[0026] S2, heat-treating the formed silicon carbide green body to decompose the solid organic matter, that is, to obtain a silicon carbide green body containing defects.

[0027] It should be noted that, in the preparation method of the defect-containing silicon carbide green body of the present application, solid organic matter is added in the process of preparing the silicon carbide green body, and high-temperature heat treatment is used to decompose the solid organic matter into gas and remove it, so that after The position of the solid organic matter in the silicon carbide body will leave certain defects. The shape, size and quantity of the defect can be controlled. At the same time, the adde...

Embodiment 1

[0042] The method for preparing a defect-containing silicon carbide biscuit provided in the embodiment of the present application includes the following steps:

[0043] S1. Add 50g of acrylamide and 25g of methylenebisacrylamide into 1000ml of water and mix evenly to obtain a premix;

[0044] S2. Add 3000g of silicon carbide powder and 3g of spherical epoxy resin to the premix, and stir to obtain a slurry;

[0045] S3. Add 1ml of tetramethylethylenediamine and ammonium persulfate solution to the slurry to continue stirring, then pour it into a mold, and after curing and molding, place it in a constant temperature and humidity cabinet to dry to obtain a silicon carbide green body; wherein ammonium persulfate The preparation method of the solution is: add 8g of ammonium persulfate into 10g of water, and dissolve to obtain the ammonium persulfate solution;

[0046] S4. Put the silicon carbide green body in a vacuum sintering furnace, first raise the temperature from room tempera...

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Abstract

The invention provides a defect-containing silicon carbide biscuit and a preparation method and a nondestructive testing method thereof, and the preparation method of the silicon carbide biscuit comprises the following steps: adding a solid organic matter in the process of preparing a silicon carbide green body, and molding; and carrying out heating treatment on the formed silicon carbide green body to decompose the solid organic matters, thereby obtaining the silicon carbide biscuit containing defects. According to the method, the solid organic matter is added in the process of preparing the silicon carbide green body, and high-temperature heating treatment is utilized to decompose the solid organic matter into gas so as to remove the gas, so that certain defects are remained at the position of the solid organic matter in the silicon carbide green body, and the shape, size and number of the defects are controllable; meanwhile, the added organic matters can be removed in the high-temperature treatment process, and new impurities cannot be introduced; according to the method, defects can be left in the silicon carbide biscuit, operation is easy and convenient, operability is high, and later nondestructive testing work is facilitated.

Description

technical field [0001] The invention relates to the technical field of non-destructive testing, in particular to a defect-containing silicon carbide blank, a preparation method thereof, and a non-destructive testing method. Background technique [0002] Silicon carbide material has the advantages of high elastic modulus, moderate density, small thermal expansion coefficient, high thermal conductivity and thermal shock resistance, high specific stiffness and high dimensional stability, so it is a space optical The ideal material for the mirror body of remote sensors has been widely used in the preparation of space mirror blanks in recent years. Reaction sintered silicon carbide has the advantages of simple process, short sintering time, low sintering temperature and cost, net size sintering, and easy preparation of large and complex shape products. Therefore, it has become the first structural ceramic to achieve large-scale industrial applications and has broad application pr...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): C04B38/06C04B35/565C04B35/622C04B35/638C04B35/634G01N23/00G01N23/04
Inventor 徐传享崔聪聪张舸朱万利张巍李伟
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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