Electronic component translation type test sorting machine

Abstract

The invention discloses an electronic component translation type test sorting machine, and belongs to the technical field of chip test equipment. The sorting machine has an electronic component low temperature test function; the sorting machine comprises material pipes, a feeding and conveying area, a test area and a discharging and conveying area, wherein the material pipes comprise a feeding material pipe used for feeding and a discharging material pipe used for discharging; the sorting machine further comprises a first-stage sealing cavity and a second-stage sealing cavity, wherein the first-stage sealing cavity is filled with drying gas; the test area is located in the first-stage sealing cavity; the feeding and conveying area and the discharging and conveying area are located in the second-stage sealing cavity; the first-stage sealing cavity and the second-stage sealing cavity can be communicated, and the material pipes and the second-stage sealing cavity can be communicated, and therefore, the electronic elements can be borne. In the scheme, sealing is arranged in the test area, and besides, the feeding and conveying area and the discharging and conveying area close to the test area are also sealed, so that the sealing range is enlarged, the dissipation of dry gas in the testing sealing cavity is reduced and slowed down, the dry environment of the testing area is ensured, and the frost and dew prevention effect is improved.

Description

technical field [0001] The invention relates to the technical field of chip testing equipment, in particular to a translational testing and sorting of electronic components. Background technique [0002] Nowadays, with the continuous development and innovation of science and technology, there are more and more applications and demands for integrated circuit (IC). A series of electrical performance tests must be performed to ensure the product quality of electronic components. However, with the continuous development and improvement of the functions of electronic components, the requirements for the testing environment of electronic components are getting higher and higher, and the testing requirements are becoming more and more extensive. [0003] At present, the types of sorting machines on the market can be divided into gravity sorting machines, translational sorting machines, automatic sorting machines and probe stations, etc. Electronic components without pins or short ...

AI Technical Summary

Problems solved by technology

However, when the three-temperature test sorter is in a low-temperature test environment, the water vapor in the air will condense when it reaches a certain level, causing frost condensation and affecting the test results. In order to solve the problem of frost condensation during low-temperature testing, the existing In the technology, a sealed cavity is set in the test area of ​​the three-temperature test sorter, and dry gas is filled into the sealed cavity to ensure that the test area is a dry environment, so as to reduce the water vapor content and dew point, but the volume of the three-temperature test sorter Larger, the sealing of the test area is generally realized by a glass cover and a metal sheet. The sealing effect of the metal sheet is poor, causing a large amount of dry gas to escape, and the external water vapor will also enter the sealed cavity, thereby preventing frost and condensation. No obvious improvement

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