Method for detecting defects of die-cut product

A product defect and detection method technology, which is applied in the direction of optical testing of defects/defects, measuring devices, and material analysis through optical means, can solve the problems of low detection efficiency and detection stability, increase accuracy and improve detection efficiency , the effect of improving stability

Pending Publication Date: 2022-01-11
SUZHOU YIMEIDE TECH CO LTD
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Problems solved by technology

[0004] In order to overcome the defects in the prior art, an embodiment of the present invention provides a method for detecting defects of die-cut products, which is used to solve the above problems of low detection efficiency and detection stability

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  • Method for detecting defects of die-cut product
  • Method for detecting defects of die-cut product

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Embodiment Construction

[0029] Next, the technical solutions in the embodiments of the present invention will be described in connection with the drawings of the embodiments of the present invention, and it is understood that the described embodiments are merely the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art are in the range of the present invention without making creative labor premise.

[0030] like Figure 1 to 5 As shown, the detection method of the die cut product of the present embodiment includes the following steps:

[0031] The original image information of the die cut product 2 is acquired using the optical station 1, which includes a surface array camera 11, a telephoto lens 12, and a light source unit 13 disposed toward the die cut product 2, the light source unit 13. Includes coaxial light far and annular light source 132 of mutual switching. Since the ...

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Abstract

The invention discloses a method for detecting defects of a die-cut product, which comprises the following steps: obtaining original image information of a die-cutting product by using an optical work station, wherein the optical work station comprises an area-array camera, a telecentric lens and a light source unit which are arranged towards the die-cutting product, and the light source unit comprises a coaxial light source and an annular light source which are mutually switched; performing coarse positioning on the original image information, and performing gray processing to obtain a product area; precisely positioning and correcting the product area, and obtaining the precise product area; carrying out region segmentation on the precise product are according to a gray value to obtain sub-areas; and performing defect feature extraction on the sub-areas, performing defect marking on original image information, and counting the number of defects. According to the invention, the defect features in the obtained image information can be obvious, so that the detection stability is improved. In addition, the area where specific flaws need to be analyzed can be reduced, so that the detection efficiency is improved.

Description

Technical field [0001] The present invention relates to product testing, and in particular a method for die-cutting is the detection of defects. Background technique [0002] With the development of 3C electronic products, all kinds of new emerging technologies, 3C electronic product testing market with unprecedented. Replacement and upgrading of products increasing speed, increasing demand detection, detection efficiency for new challenges. Improve the quality of consumer demand for 3C electronic products, making quality parts for 3C electronic products requirements need improvement, defect size products are also increasingly smaller, which increases the requirements for the testing industry. [0003] The traditional manual microscopic detection is detected by visual observation. Product testing demand, time-consuming manual inspection will increase, long working hours to produce visual fatigue, minor flaws will cause the omission of some products. Manual inspection of subjectiv...

Claims

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Application Information

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IPC IPC(8): G01N21/88
CPCG01N21/8851G01N2021/8887
Inventor 顾勇强张深逢许肖丰蔡大帅
Owner SUZHOU YIMEIDE TECH CO LTD
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