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Implanted electrode universal connection structure and device for electromagnetic compatibility injection voltage testing

A technology of implanting electrodes and connecting structures, which is applied to measurement devices, measurement device housings, implanted stimulators, etc., can solve problems such as low test efficiency, and achieve the effects of improving test efficiency and reducing test costs.

Pending Publication Date: 2021-04-13
TSINGHUA UNIV +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Therefore, the technical problem to be solved by the present invention is to overcome the defect that the injection voltage testing device used for implantable neurostimulator electromagnetic compatibility testing in the prior art can only be tested for one type of implanted electrode, and the testing efficiency is low. Thereby providing a universal connection structure and device for implanted electrodes for EMC injection voltage testing that can be tested for implanted electrodes of different specifications

Method used

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  • Implanted electrode universal connection structure and device for electromagnetic compatibility injection voltage testing
  • Implanted electrode universal connection structure and device for electromagnetic compatibility injection voltage testing

Examples

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Embodiment 1

[0041] In order to solve the defect of low testing efficiency caused by only testing implanted electrodes of one specification in the prior art, such as figure 1 As shown, the present embodiment provides a general connection structure of implanted electrodes for EMC injection voltage testing, which is used to electrically connect the implanted electrodes to the injection voltage testing device for EMC testing of implantable neurostimulators. The structure includes a base and a number of conductive terminals. in,

[0042] The base is provided with installation guide structures for installing implanted electrodes of different specifications. Preferably, the shape and size of the installation guide structure are designed according to implanted electrodes of different specifications. A plurality of conductive terminals are movable and arranged in the installation guide structure at intervals, and the plurality of conductive terminals are configured as electrode contacts of the i...

Embodiment 2

[0050] This embodiment provides a general connection structure for implanted electrodes, which is essentially a cylindrical connection structure 212 for the direction electrode 4. The difference between the connection structure provided by this embodiment and the connection structure of Embodiment 1 is:

[0051] The base is in the shape of a cylinder, and the installation guide structure is a track formed on the inner wall of the tube, which is used to install direction electrodes 4 of different specifications; sheet 258, the plurality of metal sheets 258 are configured to fit and establish electrical connection with a plurality of electrode contacts of the direction electrode 4 inserted into the barrel. The direction electrode 4 is inserted into the cylindrical connection structure, and the metal sheet 258 is in contact with the electrode contact of the direction electrode 4 to realize electrical connection. Each metal piece 258 is electrically connected to the second socket ...

Embodiment 3

[0054] A universal connection device for implanted electrodes, used to electrically connect the implanted electrodes to an injection voltage testing device for implantable neurostimulator electromagnetic compatibility testing, the universal connection device includes: a second socket 24, several connecting wires 222 and The general connection structure of implanted electrodes. in,

[0055] The structure of the second socket 24 can refer to the structure of the second socket 24 disclosed in CN209728070U. The second plug terminal 24 includes several connection contacts connected to the injected voltage test channel. A plurality of connecting wires 222 have the same material, wire diameter and length, and one end of the connecting wires 222 is connected to the connecting contact. The general connection structure of implanted electrodes adopted in this embodiment is the connection structure provided in Embodiment 1 or Embodiment 2, wherein the conductive terminal of the connecti...

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Abstract

The invention provides an implanted electrode universal connection structure and device for electromagnetic compatibility injection voltage testing. The implanted electrode universal connection structure is used for electrically connecting implanted electrodes to an injection voltage testing device for electromagnetic compatibility testing of an implanted nerve stimulator. Since the implanted electrodes of different specifications have different structures and contact distances, the positions of conductive terminals in a mounting guide structure of a base can be adjusted according to the electrode contact distances of the implanted electrodes of different specifications, that is, the conductive terminals are moved and positioned according to the electrode contact distances of the implanted electrodes, so that the conductive terminal distances are consistent with the electrode contact distances of the implanted electrodes, universal electrical connection with the implanted electrodes of different specifications is realized, testing equipment does not need to be replaced additionally for the implanted electrodes of different specifications during injection voltage testing, the testing cost is reduced, and the testing efficiency is improved.

Description

technical field [0001] The invention relates to the technical field of implantable medical instruments, in particular to a general connection structure of implanted electrodes for electromagnetic compatibility injection voltage testing, a device with the general connection structure, and an electromagnetic sensor for implantable neurostimulators with the device. Injection voltage test set for compliance testing. Background technique [0002] For active implantable neurostimulators, electromagnetic interference protection tests are required, especially for the frequency 16.6Hz-80MHz electromagnetic interference protection tests. Considering the influence of magnetic field and electric field coupling on patient leads, a complete machine test is required (including not only The stimulator itself, including lead parts such as extension leads and electrodes). The traditional method uses manual testing, which has low testing efficiency and low accuracy. [0003] In order to solv...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): A61N1/36G01R1/04G01R31/00
CPCA61N1/3605G01R1/0416G01R1/04G01R31/001
Inventor 王伟明李冰李路明吴峰艾飞
Owner TSINGHUA UNIV
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