System and method for timing calibration of time-interleaved data converters

Abstract

A method for calibrating time interleaved samplers comprising applying a calibration signal to a time-interleaved sampling device, wherein the signal is coherent with at least one sample clock on the device and is periodic and has a predetermined spectral content and frequency, sampling, by said time-interleaved sampling device, the calibration signal at a plurality of phases to form samples, averaging the formed samples, and calculating the phase error of each sample based on the average calibration signal sample.

Description

BACKGROUND OF THE INVENTION[0001]All digital systems that interact with the real world must convert continuous analog signals into a discrete representation and / or convert those discrete representations back into continuous signals. Devices that bridge the gap between the analog and digital world are known as data converters. Not surprisingly, digital-to-analog converters (DACs) and analog-to-digital converters (ADCs) are employed in a wide variety of applications including telecommuncations, medical imaging, consumer electronics, and general purpose measurement. Systems comprising DAC and ADC components can be characterized by their sampling rate, which is a measurement of how frequently the system converts an analog voltage to a digital sample or a digital sample to an analog voltage. The capacity or bandwidth of systems analyzing incoming analog waveforms is limited by the sampling rates of component ADCs.[0002]A current approach to increase the overall sampling rate of a data co...

AI Technical Summary

Benefits of technology

The present invention provides methods for calibrating time-interleaved sampling devices used in various applications such as mass spectrometry, military applications, and software radio. The methods involve applying a calibration signal to the device, sampling the calibration signal at multiple phases, averaging the samples, and calculating the phase error of each sample. This calibration can reduce the software support required and lead to reduced calibration time and cost. The invention also includes methods for calibrating converters on separate instruments and analyzing data obtained from the calibration to determine the frequency response of the system. The technical effects of the invention include improved accuracy and efficiency in calibrating time-interleaved systems and reduced test time and cost.

Problems solved by technology

The capacity or bandwidth of systems analyzing incoming analog waveforms is limited by the sampling rates of component ADCs.

While interleaving components such as ADCs or DACs is a powerful technique for increasing the maximum sampling rate of a signal processing system, the performance of interleaved converters is limited by offset and gain mismatches as well as by timing errors between interleaved slices.

Significant memory requirements impact the physical size and cost of manufacturing a data conversion system.

Unfortunately, long capture records demand more high speed sample storage, such as high speed RAM, and sample storage is limited in high-speed ADCs.

Off-chip methods for timing calibration that use memory external to a data converter tend to be more computationally complex and necessarily much slower.

A direct implementation of these off-chip methods for on-chip calibration is inefficient and computationally intensive.

Lastly, although few data converters have on-chip timing calibration systems, some already incorporate timing adjustment circuits.

A remaining hurdle in implementing on-chip timing calibration is determining those timing adjustments to be made by the timing adjustment circuits.

Images