Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Processing technology for improving peeling rate of aleurone layer and wheat bran layer in wheat processing

A wheat cortex and processing technology, which is applied in food ultrasonic treatment, grain treatment, food drying and other directions, can solve the problems of loss of nutrients, increase of by-products, reduction of utilization rate, etc., to enhance nutrition and quality, reduce bonding strength, The effect of reducing the contact area

Pending Publication Date: 2021-01-22
安徽康美达面业有限责任公司
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Under this process condition, the extraction rate of wheat core flour is 30%-40%, the extraction rate of Fuqiang 70 flour is 70%-75%, the nutritional components of wheat cortex, aleurone layer and other parts are greatly lost, and the content of dietary fiber is reduced. Long-term single consumption will affect the human body's comprehensive intake of wheat nutrients; at the same time, excessive processing will also lead to a series of problems such as increased by-products, increased energy consumption, and serious food waste.
[0003] Modern flour milling technology can increase the flour extraction rate as much as possible by adjusting the process technology and improving the operation method. At the same time, there are many studies on the separation process of the wheat aleurone layer and its application in food, but the direct grinding of the aleurone layer However, the research on high flour extraction rate processing technology that avoids excessive bran entry has been rarely touched

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Processing technology for improving peeling rate of aleurone layer and wheat bran layer in wheat processing

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0015] A processing technology for improving the peeling rate of aleurone layer and wheat cortex in wheat processing, the specific technology is as follows:

[0016] 1) According to the mass volume ratio of cornstarch and deionized water is 1:5g / mL, put the weighed cornstarch in a container, add deionized water to stir evenly and adjust the pH to 4.5, 400W ultrasonic treatment for 15min, place in Preheat in a water bath at 52°C for 10 minutes, then add α-amylase and glucoamylase according to 5.5% and 1.3% of the mass of cornstarch. The starch solution was vacuum filtered, washed with deionized water, filtered, and freeze-dried at -20°C for 20 hours to obtain porous starch;

[0017] 2) According to the mass-volume ratio of 1:100g / mL, add the weighed chitosan into 0.09M hydrochloric acid solution, and fully stir in an oil bath at 103°C to obtain acid-degraded chitosan with a viscosity-average molecular weight of 100KDa. Standby, according to the mass ratio of acid-degraded chit...

Embodiment 2

[0021] A processing technology for improving the peeling rate of aleurone layer and wheat cortex in wheat processing, the specific technology is as follows:

[0022] 1) According to the mass volume ratio of cornstarch to deionized water is 1:8g / mL, put the weighed cornstarch in a container, add deionized water to stir evenly and adjust the pH to 5.0, 450W ultrasonic treatment for 18min, place in Preheat in a water bath at 53°C for 12 minutes, then add α-amylase and glucoamylase according to 5.8% and 1.5% of the mass of corn starch, and after 25 hours of enzymolysis reaction in a constant temperature water bath, inactivate the enzyme activity to terminate the reaction. Vacuum suction filtration of the starch solution, washing with deionized water, suction filtration, and freeze-drying at -25°C for 23 hours to obtain porous starch;

[0023]2) According to the mass-volume ratio of 1:110g / mL, add the weighed chitosan into 0.093M hydrochloric acid solution, and fully stir in an oil...

Embodiment 3

[0027] A processing technology for improving the peeling rate of aleurone layer and wheat cortex in wheat processing, the specific technology is as follows:

[0028] 1) According to the mass volume ratio of cornstarch and deionized water is 1:10g / mL, put the weighed cornstarch in a container, add deionized water to stir evenly and adjust the pH to 5.5, 450W ultrasonic treatment for 20min, place in Preheat in a water bath at 55°C for 15 minutes, then add α-amylase and glucoamylase according to 6.0% and 1.6% of the mass of corn starch, and after 26 hours of enzymolysis reaction in a constant temperature water bath, inactivate the enzyme to terminate the reaction Vacuum suction filtration of the starch solution, washing with deionized water, suction filtration, and freeze-drying at -30°C for 25 hours to obtain porous starch;

[0029] 2) According to the mass-volume ratio of 1:120g / mL, add the weighed chitosan into 0.096M hydrochloric acid solution, and fully stir in an oil bath a...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
Viscosity average molecular weightaaaaaaaaaa
Login to View More

Abstract

The invention discloses a processing technology for improving the peeling rate of an aleurone layer and a wheat bran layer in wheat processing, and relates to the technical field of wheat processing.The specific technology is as follows: 1) preparing porous starch; 2) performing acidolysis treatment on chitosan, and performing cross-linking with the porous starch to obtain cross-linked porous starch; 3) pretreating wheat; and 4) dispersing the cross-linked porous starch in white oil to obtain impregnation liquid, performing vacuum pressure impregnation treatment on the pretreated wheat, and then performing wheat wetting treatment again. According to the technology method provided by the invention, the peeling rate of the aleurone layer and the wheat bran layer in wheat processing can be increased, so that the aleurone layer and the wheat bran layer are easily peeled and separated, the content of the aleurone layer in flour can be increased, and the nutrition and the quality of the flour are improved.

Description

technical field [0001] The invention belongs to the technical field of wheat processing, and in particular relates to a processing technology for improving the peeling rate of aleurone layer and wheat cortex in wheat processing. Background technique [0002] As one of the staple foods of human beings, wheat grain is rich in nutrients, but the distribution is not balanced. Starch and protein are mainly distributed in the endosperm, while a large amount of dietary fiber, minerals and vitamins are concentrated in the cortex, aleurone layer and embryo. Among them, the aleurone layer is rich in protein, dietary fiber, B vitamins and various minerals necessary for the human body, such as potassium, magnesium, iron, zinc, selenium, etc., and is an important source of wheat nutrients. However, since the aleurone layer is located between the seed coat and endosperm, it is closely adhered to the wheat cortex, and it is extremely difficult to separate. In order to ensure the taste of...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): A23L29/30A23L5/30A23L7/10B02B1/04
CPCA23L29/30A23L7/198A23L5/32B02B1/04A23V2002/00A23V2300/10A23V2300/48
Inventor 解传雷
Owner 安徽康美达面业有限责任公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com