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Multi-mode array type scanning imaging device combined with multi-photon excitation

A scanning imaging, multi-mode technology, used in measurement devices, material excitation analysis, optics, etc., can solve the problems of slow imaging speed, difficult to improve resolution, and the effect of thick sample scattering, and achieve the effect of improving scanning speed.

Inactive Publication Date: 2020-03-31
HARBIN INST OF TECH
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Problems solved by technology

[0006] In order to solve the problems of serious scattering effect of thick samples, difficulty in improving resolution, and slow imaging speed, a microscopic imaging method combining multiphoton excitation and arrayed multi-focus structured light illumination was proposed. The function of optical slicing realizes the detection of thick samples, and the wide-field fluorescence microscope can use ordinary semiconductor lasers to realize the imaging of transparent samples, and realize the switching of various modes through the combination of beam splitters

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  • Multi-mode array type scanning imaging device combined with multi-photon excitation

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Embodiment Construction

[0036] Embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings

[0037] A multi-mode array scanning imaging device combined with multi-photon excitation in this example includes that in the multi-photon excitation mode, the illumination source is provided by a titanium sapphire pulsed femtosecond laser (1), and the optical shutter (2) is used to realize the light source. Switch control, the polarizer (3) and the half-wave plate (4) are used to control the laser power, the beam is reflected by the first reflector (6) to the first beam splitter (7), and the semiconductor laser (5) acts as a single photon The light source for experiments and common fluorescence imaging can combine two beams of light through the first beam splitter (7), so that different imaging modes can be combined. The beam conversion unit (8) is a beam expander composed of a lens pair with a focal length ratio of 1:2, which realizes twice the beam ex...

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Abstract

The invention discloses a multi-mode array type scanning imaging device combined with multi-photon excitation, and belongs to the field of optical microscopic measurement. Aiming at different imagingrequirements of a transparent thin sample and a thick scattering sample, the multi-mode imaging device combining multi-photon excitation imaging and common wide-field fluorescence imaging is designedthrough selection of different light sources, and the two light sources can realize switching of multiple modes through combination of a beam splitter. A fixed micro-lens array is used for accuratelycontrolling an illumination mode and the position of an excitation point so as to generate sparse focus illumination, rapid scanning of a sample is completed, rapid double-resolution imaging of a transparent sample and a thick sample is achieved, and meanwhile the image contrast of the thick scattering sample is improved. Moreover, an adaptive aberration correction unit is introduced into the imaging system, so that the aberration of the system is reduced or eliminated, and the imaging depth and the imaging quality in a multi-photon imaging mode are improved.

Description

technical field [0001] A multi-mode array scanning imaging device combined with multi-photon excitation belongs to the field of optical microscopic measurement, and mainly relates to a multi-focus scanning micro-imaging device that can realize two-photon excitation and ordinary fluorescence detection. It specifically relates to a multi-mode array scanning imaging device that combines traditional wide-field imaging and two-photon imaging. Specifically, under different imaging requirements, the sample fluorescence is excited by a semiconductor laser and a pulsed femtosecond laser, and a fixed micro The lens array precisely controls the illumination pattern and the position of the excitation point to generate sparse focal illumination, enable fast scanning of the sample, and improve imaging contrast. At the same time, the system aberration is reduced through the adaptive aberration correction device, and the imaging quality is improved. Background technique [0002] In recent ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02B27/58G02B21/00G02B21/06G02B21/36G01N21/64
CPCG01N21/6458G02B21/0076G02B21/06G02B21/361G02B27/58
Inventor 王伟波张宝元吴必伟谭久彬
Owner HARBIN INST OF TECH
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