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Method for solid ablation direct analysis based on plasma jet and implementation apparatus thereof

A plasma and solid technology, applied in the field of analysis, can solve the problems such as the influence of the accuracy and stability of the test method, the lack of simultaneous multi-element analysis ability, and the inability to realize the on-site detection of samples, so as to avoid the use of dangerous chemical reagents and shorten the detection time. Time, easy-to-operate effects

Inactive Publication Date: 2019-11-26
CHENGDU ALIEBN SCI & TECH CO LTD
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  • Summary
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  • Description
  • Claims
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Problems solved by technology

[0002] At present, the analysis of solid samples is often carried out by wet digestion, that is, before the instrumental analysis, the solid sample must be crushed, ground and digested. Due to the complexity and tediousness of the pretreatment process, it often takes a long time. Difficult to be used for on-site rapid detection; at the same time, it will introduce uncertain factors in the analysis and test, increase the uncertainty of the method, and then affect the accuracy and stability of the test method; in addition, the digestion process of the sample often requires The use of dangerous chemical reagents such as perchloric acid, concentrated nitric acid or caustic soda cannot meet the development requirements of green analysis
[0003] The direct sampling analysis of solid samples has always been an important part of modern analytical science. The commonly used solid sampling methods include laser ablation, electrothermal evaporation sampling and electric spark ablation. These indirect sampling methods often need to be installed in the experimental device. Adding additional components such as graphite furnaces, lasers, electric heating components, etc. on the basis increases the complexity of the device and cannot achieve on-site detection of samples
Although the X-ray diffractometer (XRF), which has been developed rapidly in recent years, has a simple device and can directly analyze solid samples on site, this method has low sensitivity, insufficient ability to analyze multiple elements at the same time, takes a long time, has serious spectral line interference, and is difficult to detect light element

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  • Method for solid ablation direct analysis based on plasma jet and implementation apparatus thereof
  • Method for solid ablation direct analysis based on plasma jet and implementation apparatus thereof
  • Method for solid ablation direct analysis based on plasma jet and implementation apparatus thereof

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Embodiment Construction

[0032] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0033] The method of direct analysis of solid ablation based on plasma jet and its implementation device disclosed in the present invention, the discharge gas enters the discharge tube to absorb microwave energy to generate microwave plasma jet, and under the precise control of the high-precision translation stage, the plasma with high energy density The tail flame ablates the solid, realizes the atomization and excitation of the elements in the solid sample, and realizes the qualitative and quantitative detection of the elements in the sample by collecting the atomic emission spectrum signal. Its analysis program mainly includes:

[0034] (1) The obtained solid sample is subjected to a simple grinding process, and the powder sample is subjected to tableting treat...

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Abstract

The invention discloses a method for solid ablation direct analysis based on a plasma jet. The method comprises the following steps: step one, carrying simple smoothing treatment on a solid sample andcarrying out tabletting on a powder sample to obtain a test sample; adding a liquid sample dropwise on a base material by a pipette and preparing a test sample; step two, moving the test sample to bein contact with a plasma tail part by using a sample injection system, moving the sample to enable a plasma jet to ablate the solid object continuously, and collecting spectral signals continuously during the ablation period; and step three, comparing an atomic emission spectrum chart of the obtained sample with a sample spectrum chart with the known concentration to obtain qualitative and quantitative analysis results of the elements. In addition, the invention also discloses an apparatus for the method. According to the invention, under the mutual effect of the plasma and the solid object,the atomization and excitation of elements in the sample are realized; and the qualitative and quantitative detection of elements in a sample is realized by collecting an atomic emission spectrum signal.

Description

technical field [0001] The invention relates to the field of analysis, in particular to a method for direct analysis based on plasma jet solid ablation and an implementation device thereof. Background technique [0002] At present, the analysis of solid samples is often carried out by wet digestion, that is, before the instrumental analysis, the solid sample must be crushed, ground and digested. Due to the complexity and tediousness of the pretreatment process, it often takes a long time. Difficult to be used for on-site rapid detection; at the same time, it will introduce uncertain factors in the analysis and test, increase the uncertainty of the method, and then affect the accuracy and stability of the test method; in addition, the digestion process of the sample often requires The use of dangerous chemical reagents such as perchloric acid, concentrated nitric acid or caustic soda cannot meet the development requirements of green analysis. [0003] The direct sampling ana...

Claims

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Application Information

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IPC IPC(8): G01N21/71G01N1/28
CPCG01N21/71G01N1/28H01J37/32211H01J37/32266H01J37/3244H01J2237/0817H01J2237/141
Inventor 杨燕婷刘卓
Owner CHENGDU ALIEBN SCI & TECH CO LTD
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