Photoelectric coupler low frequency noise test clamp

A technology of photoelectric coupler and test fixture, which is applied in the direction of noise figure or signal-to-noise ratio measurement, measuring device casing, etc., can solve the problems affecting the detection results, etc., and achieve the goal of improving accuracy, simple and accurate positioning, and ensuring self-excitation phenomenon Effect

Pending Publication Date: 2019-10-22
武汉格物芯科技有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, when the quality of optocouplers is detected by low-frequency noise, interference signals are often generated, which affects the detection results

Method used

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  • Photoelectric coupler low frequency noise test clamp
  • Photoelectric coupler low frequency noise test clamp
  • Photoelectric coupler low frequency noise test clamp

Examples

Experimental program
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Embodiment Construction

[0036] The present invention will be further described below in conjunction with accompanying drawing.

[0037] figure 1 A test fixture for low frequency noise of a power photocoupler according to an embodiment of the present invention is schematically shown. According to the low-frequency noise test jig of the photocoupler of the present invention, it can especially shield interference signals during the test process and improve the accuracy of test results.

[0038] Such as figure 1 and figure 2 As shown, the photocoupler low-frequency noise test fixture described in this embodiment includes a base 11 . The base 11 is provided with a circuit board 2, and the circuit board 2 is provided with a positioning socket 21 for installing the photocoupler 3 under test. The circuit board 2 is provided with a test circuit, which is used for testing the optocoupler, and the quality of the optocoupler is tested by connecting the low noise voltage through the optocoupler. Wherein, th...

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Abstract

The invention relates to a photoelectric coupler low frequency noise test clamp and belongs to the electronic device detection equipment. The clamp comprises a pedestal, a circuit board and a shielding structure, wherein the circuit board is arranged in the pedestal, the circuit board is provided with a positioning tube seat used for installing a tested photoelectric coupler, and a circuit is provided with a test circuit for testing the photoelectric coupler; and the shielding structure is arranged on the pedestal, and the shielding structure provides a space for shielding an interference signal and an external interference signal of the test circuit for the circuit board. In the invention, during a test process, the interference signal is shielded and accuracy of a test result is increased.

Description

technical field [0001] The invention relates to a low-frequency noise test fixture for a photoelectric coupler, which belongs to electronic device testing equipment. Background technique [0002] The inherent noise of electronic devices, especially low-frequency noise, can sensitively reflect the microcosmic or defect differences caused by differences in device materials, structures, and processes. Therefore, the low-frequency noise of electronic devices can also be applied to the research of device quality and reliability characterization. From the theory of low-frequency noise, it is known that imperfections in semiconductor devices can cause low-frequency noise. By testing the noise of devices with incompleteness, the deep-level defect energy level of the device, the trapping interface, the degeneracy of defects, and the spatial distribution information and energy distribution of defects can be obtained. [0003] A photocoupler is an electrical-optical-electrical conver...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/04G01R29/26
CPCG01R1/04G01R29/26
Inventor 何黎陈芳孔舒
Owner 武汉格物芯科技有限公司
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