Insulator pollution component identification method based on microscopic hyperspectral technology
An identification method and technology for insulators, which are used in optical testing flaws/defects, image data processing, instruments, etc., can solve the problems of inability to observe the distribution of contamination components on the surface of insulators, and the operation process is cumbersome, so as to eliminate light source inhomogeneity and operation process Simple, noise-removing effects from images
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[0041] Such as figure 1 As shown, the embodiment of the present invention discloses a method for identifying pollution components of insulators based on microscopic hyperspectral technology, including the following steps:
[0042] S1: Select the sampling area, disassemble part of the insulators and bring them back and record their picking positions, windward side, leeward side and other information one by one, cut the insulating sheet to get the dirty sample of the polluted insulator, and obtain the microscopic hyperspectral image, according to the statistical law (Statistical law is an expression of the classification training set and test set, such as trying to make the data balance when dividing, not excessively tilted, etc.) Divided into the first atlas set and the second atlas set;
[0043] Correction processing, choose the black and white correction method, the formula is:
[0044]
[0045] In the formula, R ci Image data corrected for black and white; Sample ciis ...
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