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Boron-containing dopant slurry and application thereof

A boron doping and slurry technology, applied in the directions of diffusion/doping, electrical components, crystal growth, etc., can solve the problems of high cost, high cost of silicon ball preparation, high temperature, etc., to prevent aggregation, reduce the influence of attenuation, damage reduction effect

Inactive Publication Date: 2019-06-07
CHANGZHOU SHICHUANG ENERGY CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, there are two problems that cannot be avoided: one is the high cost of preparing silicon spheres, especially the nanoscale silicon spheres mentioned in the patent, which are very expensive; the other is that according to the patent, the boron doping of silicon spheres depends on silicon spheres together Boron enters the silicon substrate together to complete this process, but this process requires a higher temperature, which cannot be achieved by ordinary thermal diffusion. It must be combined with laser doping local high temperature diffusion method
Patent CN103059666A provides a coating solution for boron diffusion, which is only suitable for traditional high-temperature boron doping process

Method used

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  • Boron-containing dopant slurry and application thereof
  • Boron-containing dopant slurry and application thereof
  • Boron-containing dopant slurry and application thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0056] 1) Trihexyl borate 35g, 1,2-butanediol 20g, decyl dihydroxyethylamine 2g, erucic acid dimethyl ammonium acetate 1.5g, polyvinyl alcohol 0.8g, calcium oxide 18g, capric acid Add 1.5 g of stearyl alcohol ester and 23 g of water into the reaction kettle in sequence, and stir and mix evenly at 70 ° C to obtain the boron-containing dopant slurry;

[0057] 2) Select a P-type oriented monocrystalline silicon wafer with a resistivity of 1-3Ω·cm, after conventional cleaning, polishing and pickling, and then print the slurry obtained in step 1) on the silicon wafer. The printing pattern is a line shape structure, with a line width of 100 microns and a line spacing of 1.5 mm; after printing, dry at 300°C for 2 to 3 minutes;

[0058] 3) Place the silicon wafer treated in step 2) in a chain diffusion furnace for boron diffusion. The diffusion temperature is controlled at 775-780°C, and the diffusion time is controlled at 15-18 minutes; the resistance after diffusion is 58-67Ω / □ ; ...

Embodiment 2

[0061] 1) Diheptyl methoxy borate 35g, 1,2-butanediol 20g, dodecyl dihydroxyethylamine 2g, erucic acid dimethyl ammonium acetate 1.5g, polyvinyl alcohol 0.4g, oxidation Add 10g of magnesium, 1.5g of stearyl laurate, and 30g of water into the reaction kettle in sequence, and stir and mix evenly at 70°C to obtain a boron-containing dopant slurry;

[0062] 2) Select a P-type oriented monocrystalline silicon wafer with a resistivity of 1-3 Ω·cm, after conventional cleaning, polishing and pickling, and then print the slurry obtained in step 1) on the silicon wafer. The printing pattern is a circle Dot structure, 80 microns in diameter, 400 microns center-to-center; dry at 300°C for 1 to 2 minutes after printing;

[0063] 3) Place the silicon wafer treated in step 2) in a tubular diffusion furnace for boron diffusion, the diffusion temperature is controlled at 825-830°C, the diffusion time is controlled at 30 minutes, and the diffusion resistance is 60-70Ω / □; After the borosilicat...

Embodiment 3

[0065] 1) Dibutyl methoxy borate 45g, 1,2-hexanediol 10g, dodecyl dihydroxyethylamine 3g, oleic acid dimethyl ammonium acetate 1.5g, polyvinyl alcohol 1.3g, oxidation Add 5g of magnesium, 5g of calcium oxide, 1.5g of stearyl acetate, and 20g of water into the reaction kettle in sequence, and stir and mix evenly at 70°C to obtain a boron-containing dopant slurry;

[0066] 2) Select a P-type oriented monocrystalline silicon wafer with a resistivity of 1-3Ω·cm, go through conventional cleaning, alkali texturing and pickling; then print the slurry obtained in step 1) on the silicon wafer, and after printing Dry at 300°C for 2 to 3 minutes;

[0067] 3) Place the silicon wafer treated in step 2) in a chain diffusion furnace for boron diffusion, the diffusion temperature is controlled at 740-745°C, and the diffusion time is controlled at 15-20 minutes; the resistance after diffusion is 60-70Ω / □ ; After pickling to remove the borosilicate glass, the minority carrier lifetime of the ...

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Abstract

The invention provides boron-containing dopant slurry. The boron-containing dopant slurry is prepared from the following components in parts by weight: 5-70 parts of organic borate, 15-50 parts of polyol, 10-40 parts of dihydroxy ylamine and 0.1-2.5 parts of organic quaternary ammonium salt. The invention further provides a silicon wafer boron doping method. The silicon wafer boron doping method comprises the following steps that (1) the boron-containing dopant slurry is subjected to spraying or screen printing on the surface of a silicon wafer; (2) the silicon wafer treated in the step (1) isplaced into a diffusion furnace for boron diffusion, wherein the diffusion temperature is 700-850 DEG C. The boron-containing dopant slurry can realize low-temperature boron doping, thermal energy consumption can be obviously reduced, and damage to a crystal structure and electrical performance of a crystalline silicon substrate is reduced.

Description

technical field [0001] The invention relates to boron-containing dopant slurry and its application. Background technique [0002] At present, boron doping on the surface of crystalline silicon still mainly adopts vapor phase deposition and diffusion process. This method generally uses BBr 3 is the boron source, BBr 3 molecules in the diffusion furnace tube with O 2 Oxidation reaction to produce B 2 o 3 , then at high temperature B 2 o 3 It will undergo redox reaction with Si to form boron and SiO 2 , boron is diffused into crystalline silicon at high temperature, and finally forms a diffusion junction. If the crystalline silicon is p-type, a boron high-low junction is formed; if the crystalline silicon is n-type, a PN junction is formed. Almost the entire vapor deposition and diffusion process needs to be carried out in a high temperature environment above 900°C, especially in the diffusion stage, which generally requires a high temperature of 950°C to 1000°C in the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/22C30B31/04
Inventor 杨立功邓舜奚琦鹏袁丽娟潘琦
Owner CHANGZHOU SHICHUANG ENERGY CO LTD
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