Chip separation method for 3D stacked chip encapsulator
A technology of chip packaging and separation method, which is applied in semiconductor/solid-state device manufacturing, semiconductor/solid-state device testing/measurement, electrical components, etc. Electrical measurement analysis, the effect of avoiding inclined grinding damage, avoiding forced cracking or warping damage
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[0038] In this embodiment, the memory containing two chips of NAND Flash+Mobile SDRAM (the two-layer chips adopt the form of cross-stacking) is taken as an example, and the second layer of chips is obtained by separation. The separation method includes the following steps (for the technical flow chart, see figure 1 ):
[0039] (1) Determine the grinding area and its area
[0040] Scanning Acoustic Microscopy (C-SAM) memory internal structure such as figure 2 As shown, the memory is a cross-type double-sided lead package, in which, 1 is the first layer chip, and 2 is the second layer chip; the packaging material and 1 the first layer chip are determined to be the grinding area, and the area is 8mm; at the same time, the memory initial The thickness is about 1mm. According to experience, usually the uppermost packaging material accounts for about 1 / 3 of the total thickness of the memory, which provides a reference for the grinding force when grinding the packaging material in ...
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