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Front structure of power semiconductor chip and manufacturing method of front structure of power semiconductor chip

A power semiconductor, front-side structure technology, applied in semiconductor devices, electrical components, circuits, etc., can solve the problems of increased chip process costs, high-temperature processing processes, and complicated power semiconductor chip manufacturing process flow, so as to reduce manufacturing costs and reduce Process cost and the effect of reducing process difficulty

Inactive Publication Date: 2014-11-19
ZHUZHOU CSR TIMES ELECTRIC CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The preparation process of the front structure of the power semiconductor chip that requires a separate channel stop ring is complicated
Moreover, since the junction depth of the channel stop ring needs to reach a deeper depth, a higher high-temperature processing process is required, which leads to an increase in the process cost of the chip.

Method used

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  • Front structure of power semiconductor chip and manufacturing method of front structure of power semiconductor chip
  • Front structure of power semiconductor chip and manufacturing method of front structure of power semiconductor chip
  • Front structure of power semiconductor chip and manufacturing method of front structure of power semiconductor chip

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Embodiment Construction

[0049] Specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0050]Based on the research findings of the inventors, it can be seen that when the terminal structure region and the channel stop ring are separated by a preset distance, the junction depth of the channel stop ring has no direct relationship with the withstand voltage capability of the chip itself. Therefore, the channel stop ring can be Junction depth is reduced. And because the doping type of the channel stop ring is the same as that of the electrode source region, the formation process of the electrode source region and the formation process of the channel stop ring can be combined to prepare the electrode source region at the same time and the channel stop ring, thereby saving one-step photolithography process and one-step doping process, thereby achieving the purpose of optimizing the front-side process flow of the power semiconductor ch...

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Abstract

The invention provides a front structure of a power semiconductor chip and a manufacturing method of the front structure of the power semiconductor chip. The manufacturing method includes the steps of providing a substrate in the first conduction type, wherein the substrate comprises a substrate front face, and the substrate front face comprises a first son surface, a second son surface and a third son surface; forming an electrode area in a first son surface area of the substrate, and forming a channel cut-off ring in the first conduction type in the third son surface area, wherein the electrode area at least comprises an electrode, each electrode comprises a source area in the first conduction type, and the channel cut-off ring and the source areas are formed at the same time. By means of the manufacturing method, the manufacturing technological processes of the front structure of the power semiconductor chip are simplified, and technological cost is reduced. In addition, the voltage-resistant property of the chip cannot be reduced by means of the front structure of the power semiconductor chip.

Description

technical field [0001] The invention relates to the field of semiconductor devices, in particular to a front structure of a power semiconductor chip and a preparation method thereof. Background technique [0002] Generally, in order to prevent inversion of the substrate silicon surface of the semiconductor chip, and to maintain the stability of the silicon surface, reduce the reverse leakage current, prevent the creep of the breakdown voltage, and improve the withstand voltage and withstand voltage stability of the chip, in the power semiconductor chip The outermost periphery of the front is provided with a channel stop ring. The channel stop ring is doped with the same conductivity type as the chip substrate. For example, if the conductivity type of the substrate is N type, then the conductivity type of the impurity doped in the channel stop ring is also N type. [0003] In the conventional structure of the existing power semiconductor chip, the junction depth of the chan...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L29/423H01L21/28
CPCH01L29/0615H01L29/66477
Inventor 刘国友覃荣震黄建伟
Owner ZHUZHOU CSR TIMES ELECTRIC CO LTD
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