Body contact forming method by utilizing SOI (silicon on insulator) MOSFET (metal oxide semiconductor field effect transistor) of sacrificial layer

A body contact and sacrificial layer technology, applied in semiconductor/solid-state device manufacturing, electrical components, circuits, etc., can solve problems such as cumbersome manufacturing steps, complicated device manufacturing processes, and damage to the isolation effect of SOIMOSFET devices.

Inactive Publication Date: 2013-01-30
HARBIN ENG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Although this method can suppress the floating body effect of SOI MOSFET devices, it sometimes destroys the isolation effect of SOI MOSFET devices. The manufacturing process of the device is complicated, and the manufacturing steps are cumbersome, which is not conducive to reducing the production cost

Method used

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  • Body contact forming method by utilizing SOI (silicon on insulator) MOSFET (metal oxide semiconductor field effect transistor) of sacrificial layer
  • Body contact forming method by utilizing SOI (silicon on insulator) MOSFET (metal oxide semiconductor field effect transistor) of sacrificial layer
  • Body contact forming method by utilizing SOI (silicon on insulator) MOSFET (metal oxide semiconductor field effect transistor) of sacrificial layer

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Embodiment Construction

[0027] Hereinafter, the present invention will be described in detail with examples in conjunction with the drawings:

[0028] Combine figure 1 . The buried SiO is deposited on the underlying semiconductor substrate 1 as shown 2 Layer 2, buried in SiO 2 A SiGe masking film 3 is deposited on the layer 2. The material of the underlying semiconductor substrate 1 can be freely selected, for example: silicon, germanium, group III~V compound semiconductor materials, group II~VI compound semiconductor materials or other compound semiconductor materials, etc., and single crystal materials can also be used. It can be made into an n-type substrate or a p-type substrate by doping.

[0029] Combine figure 2 . Coat the photoresist 4 on the SiGe masking film 3 so that the photoresist 4 covers a small part of the SiGe masking film 3, and remove the uncoated SiGe masking film 3 by etching until the buried SiO is exposed 2 Layer 2, and the remaining SiGe masking film 3a on both sides of the buri...

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Abstract

The invention provides a body contact forming method by utilizing an SOI (silicon on insulator) MOSFET (metal oxide semiconductor field effect transistor) of a sacrificial layer. The method comprises the following steps of: depositing a buried SiO2 layer (2) on a semiconductor substrate (1) on a bottom layer, and depositing a SiGe mask membrane (3) on the buried SiO2 layer (2); etching for the first time and exposing the buried SiO2 layer (2); etching for the second time and maintaining the buried layer SiO2 layer (2) with a large area at the right side of the SiGe mask membrane (3); carrying out epitaxial growth of a silicon membrane (5) at the top layer; forming a gate oxide layer (7), and depositing a polycrystalline gate (8); etching for the third time and removing the silicon membrane (5) at the top layer of a glue-free part; etching horizontally for the fourth time and removing the remained SiGe mask membrane (3a); and carrying out epitaxial growth and compensating the silicon membrane at the top layer (5), pouring P+ ions, and depositing a metal electrode. The body contact forming method by utilizing the SOI MOSFET of the sacrificial layer has the advantages of reducing the use of the mask membrane plate, simplifying the manufacturing technology flow, and lowering the manufacturing cost.

Description

Technical field [0001] The invention relates to a method for forming electronic components. Specifically, it is a method for forming SOI MOSFET body contact using a sacrificial layer. Background technique [0002] SOI technology, as a full dielectric isolation technology, has many unparalleled advantages over bulk silicon technology. However, SOI devices themselves also have some parasitic effects. Among them, the floating body effect of partially depleted SOI devices is the biggest problem compared with bulk silicon devices, which has also become one of the reasons that restrict the development and wide application of SOI technology. The floating body effect will produce a kink effect, a decrease in the leakage breakdown voltage, an abnormal subthreshold slope, etc., which will seriously affect the performance of the device. [0003] Due to the influence of floating body effect on device performance, how to suppress the floating body effect has become a hot spot in the research ...

Claims

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Application Information

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IPC IPC(8): H01L21/336
Inventor 王颖包梦恬曹菲邵雷
Owner HARBIN ENG UNIV
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