Temperature gradient controllable wafer front-drying method and its hot plate type front drying device
A temperature gradient and wafer technology, applied in the direction of electrical components, semiconductor/solid-state device manufacturing, circuits, etc., can solve problems such as the inability to directly control the wafer temperature, and achieve excellent photolithographic effects, high integration, and excellent film properties.
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[0043] The present invention will be described in further detail below in conjunction with the accompanying drawings.
[0044] As shown in Figures 2 and 9, in the semiconductor chip manufacturing process, the hot plate type pre-baking device used for pre-baking after coating the photoresist on the wafer includes a hot plate body 4, a heater 11 and a temperature detection device 9 1. The body of furnace with four walls surrounded by the frame has three vertical needle rods for supporting the wafer 12, and also includes a lift mechanism (such as screw mandrel 5, motor 7 and encoder 6) and servo driver 8 etc., wherein: be provided with heater (can be rod-shaped or sheet structure) and chip temperature detecting device 9 (such as: Pt100 thermal resistance or thermoelectric coupler) in the hot plate body, respectively with heat Disc temperature controller 10 (prior art, commercially available) is electrically connected; Ejector pin 3 is located on the heating disc body 4, is connec...
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