Generation device, generation method, and program

Abstract

Provided is a generation device including: a test vector generation unit for selecting, for each of parameters to be included in a test vector, one value from among possible values for the parameter to generate test vectors whose combinations of values are different from each other; an extraction unit for extracting, as partial sequences each including one or more test vectors, portions of a series including the test vectors output by the test vector generation unit; and a test sequence generation unit for generating a test sequence based on the extracted partial sequences.

Description

CROSS-REFERENCE TO RELATED APPLICATION[0001]This application is based upon and claims priority from prior Japanese patent application number 2014-030275, filed Feb. 20, 2014, the entire contents of which are hereby incorporated by reference herein.BACKGROUND[0002]The present disclosure generally relates to a generation device, and more particularly relates to a generation method, and a program for generating a test sequence.[0003]Up to now, a technique for performing a test that covers a large number of input conditions, using a combinational test has been known (for example, Patent Literature 1 and Non-patent Literatures 1 and 2). Unfortunately, if the combinational test is applied to a system for receiving an ordered sequence, the number of tests could be too large and / or the test could be too long.[0004]In view of the above, a known method for testing a system for receiving an ordered sequence involves checking a test case by describing a state machine, a temporal logic, and the ...

AI Technical Summary

Benefits of technology

The present invention provides a way to make sure a test case covers a lot of data without needing to define the order in which the data should be tested. This approach helps to create a system that can receive an ordered sequence and quickly start testing without having to fully analyze the data.

Problems solved by technology

Unfortunately, if the combinational test is applied to a system for receiving an ordered sequence, the number of tests could be too large and / or the test could be too long.

Unfortunately, in general, according to this method, an input space is complicated, checking of completeness is difficult, and detailed specifications about the operation sequence received by the system as a test target are required.

Moreover, Patent Literature 2 has a problem that the test target needs to be reducible to an automaton, and Patent Literature 3 has a problem that a specific algorithm for generating the test case is not disclosed.

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