Photo mask board cleaning method
A mask and cleaning technology, applied in the field of cleaning large-scale photolithography masks for TFT-LCD industry, can solve problems such as defective products and production stagnation, and achieve the effect of preventing defective products and safe cleaning
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[0014] The preferred embodiments of the present invention are given below to describe the technical solution of the present invention in detail.
[0015] Set up the photomask dust inspection device in the exposure device.
[0016] The set items include the scope of dust inspection (referring to the area, which can be set according to the actual area of the mask, generally set as the effective area of the pattern), the level of foreign particle size judgment (can be divided into A level and B level , the setting range is from 70μm to 240μm, which can be set according to the actual cleaning degree), alarm setting (set to alarm or not to alarm when A-level or B-level foreign matter is found), and dust inspection method (one exposure task Dust check before the start or after the end) setting. Print out the results of the inspection on dust-free paper.
[0017] Cleaning of photolithography mask when the dust inspection device alarms
[0018] After the dust inspection device ...
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