Polishing method of potassium aluminate chip
A technology of lithium aluminate and wafer, which is applied in the field of lithium aluminate, can solve problems such as the difficulty of obtaining wafers, affecting the quality of polishing, and the difficulty of breaking through surface roughness, etc., achieving obvious effects and unique methods
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Embodiment 1
[0014] A polishing method of a lithium aluminate wafer, comprising the following steps:
[0015] The lithium aluminate crystal with a diameter of 2 inches and a length of 80 mm grown by the pulling method is cut into a wafer with a thickness of 0.5 to 1 mm by an inner circle cutting machine;
[0016] Put the wafer into hydrochloric acid or nitric acid with a concentration of 78%, heat it up to 80°C, keep the temperature for 15 minutes, take it out and dry it with nitrogen, observe the corrosion pits on the front and back of the wafer with a large field microscope, and select the corrosion pits The less side is used as the next polishing surface;
[0017] Put the surface of the wafer to be polished on the rubber plate, and use alumina powder to roughen it and polish it. After this process, the crystal surface with an average surface roughness of 5nm is achieved;
[0018] Fine polishing the crystal surface, using SiO with PH=8 2 Polishing liquid, the polishing time is 2 ho...
Embodiment 2
[0021] According to the steps in the above-mentioned technological process, the lithium aluminate crystal with a diameter of 2 inches and a length of 80 mm grown by the pulling method is cut into a wafer with a thickness of 1 mm with an inner circle cutting machine, and the wafer is placed in hydrochloric acid (concentration 80%) Then, the temperature was raised to 100 °C, and the temperature was maintained for 30 minutes; the wafer was taken out, dried with nitrogen, and the surface morphology of the wafer was observed under a large-field microscope, and the crystal plane with fewer corrosion pits was selected as the polished crystal plane. After rough grinding and rough polishing of alumina powder, the crystal plane with an average surface roughness of 10nm is finely polished, and SiO with PH=8 is selected. 2 Polishing solution, the polishing time is 3 hours, the crystal plane with the average surface roughness of 1.6nm can be obtained, and then the crystal plane with the ave...
Embodiment 3
[0023] The specific method is as in Example 1. The wafer is put into nitric acid (concentration 80%), heated to 80° C., maintained for 15 min, dried for observation and selected as the polished crystal plane with few corrosion pits. After rough grinding and rough polishing of alumina powder, the crystal plane with an average surface roughness of 10nm is finely polished, and SiO with PH=8 is selected. 2 Polishing solution, the polishing time is 3 hours, the crystal plane with the average surface roughness of 1.6nm can be obtained, and then the crystal plane with the average surface roughness of 0.18nm can be obtained by polishing with neutral emery for 2 hours.
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