Preparation method of high-resolution structural color device
A technology with high resolution and structural color, which is applied to the photolithographic process of patterned surface, photolithographic process coating equipment, instruments, etc., can solve the problem that the photoresist distribution uniformity and quality cannot be further improved by spin coating and drying efficiency. and other problems, to achieve the effect of improving spin coating drying efficiency, high saturation, and high resolution
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Embodiment 1
[0039] The present embodiment provides a method for preparing a high-resolution structural color device, comprising the following steps:
[0040] S1, depositing a phase change material on the substrate, and annealing to obtain a substrate with a film layer of the phase change material; wherein, the material of the substrate is selected from one of silicon, silicon dioxide, silicon carbide, silicon nitride, and sapphire or A variety of mixtures; the phase change material is selected from vanadium dioxide; the magnetron sputtering deposition method is used for deposition, the target material selected for the magnetron sputtering deposition method is a metal target, the sputtering power is 112W, the pressure is 6.8mTorr, and the growth temperature is 605°C; annealing was carried out in an annealing furnace under an argon / hydrogen atmosphere, the annealing temperature was 446°C, the annealing time was 4.2 hours, and the flow rates of argon and hydrogen were 78 sccm and 3.5 sccm, re...
Embodiment 2
[0045] The present embodiment provides a method for preparing a high-resolution structural color device, comprising the following steps:
[0046] S1, depositing a phase change material on the substrate, and annealing to obtain a substrate with a film layer of the phase change material; wherein, the material of the substrate is selected from one of silicon, silicon dioxide, silicon carbide, silicon nitride, and sapphire or A variety of mixtures; the phase change material is selected from vanadium dioxide; the magnetron sputtering deposition method is used for deposition, the target material selected for the magnetron sputtering deposition method is a metal target, the sputtering power is 115W, the pressure is 6.8mTorr, and the growth temperature is 608°C; annealing was carried out in an annealing furnace under an argon / hydrogen atmosphere, the annealing temperature was 450°C, the annealing time was 4.6 hours, and the flow rates of argon and hydrogen were 80 sccm and 4.2 sccm, re...
Embodiment 3
[0051] The present embodiment provides a method for preparing a high-resolution structural color device, comprising the following steps:
[0052] S1, depositing a phase change material on the substrate, and annealing to obtain a substrate with a film layer of the phase change material; wherein, the material of the substrate is selected from one of silicon, silicon dioxide, silicon carbide, silicon nitride, and sapphire or A variety of mixtures; the phase change material is selected from vanadium dioxide; the magnetron sputtering deposition method is used for deposition, the target material selected for the magnetron sputtering deposition method is a metal target, the sputtering power is 120W, the pressure is 7.6mTorr, and the growth temperature is 608°C; annealing using an annealing furnace in an argon / hydrogen atmosphere, the annealing temperature is 452°C, the annealing time is 4.8 hours, and the flow rates of argon and hydrogen are 82 sccm and 5 sccm, respectively.
[0053]...
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