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Time domain a/d converter group and sensor device using same

A converter, time domain technology, applied in the direction of analog-to-digital converter, analog-to-digital conversion, code conversion, etc., can solve the problem that A/D converter cannot realize high dynamic range and area increase of sensor at high speed and low power consumption , increased power consumption, etc., to achieve the effects of low readout noise, reduced power consumption, and reduced occupied area

Active Publication Date: 2020-05-26
TECH IDEA CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in order to suppress noise, a large capacitor of 10pF to 20pF is often used, resulting in not only an increase in area, but also an increase in power consumption
[0024] Therefore, A / D converters used in existing sensor devices cannot achieve the high dynamic range required by sensors at high speed and low power consumption

Method used

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  • Time domain a/d converter group and sensor device using same
  • Time domain a/d converter group and sensor device using same
  • Time domain a/d converter group and sensor device using same

Examples

Experimental program
Comparison scheme
Effect test

no. 1 approach

[0096] (A / D converter using two reference voltage signals)

[0097] figure 1 The A / D converter 60 according to the first embodiment of the present disclosure is shown. The A / D converter 60 according to the first embodiment includes a comparator 12, an internal A / D converter 30, a reference voltage selection circuit 63, and an accumulation adder-subtractor 64, wherein the reference voltage selection circuit 63 has two kinds of ramp signals Serving as a reference voltage and switching between the reference voltages, the accumulative adder-subtractor 64 is used to perform accumulative addition or accumulative subtraction on a plurality of converted values ​​and output the averaged output as an A / D converted value.

[0098] In the A / D converter 60 according to the first embodiment, the comparator 12 compares the pixel signal with the ramp signal as the reference voltage signal, generates a comparison output at the time when the two signals intersect, and controls the counter to ...

no. 2 approach

[0152] (A time-domain A / D conversion module including multiple A / D converters using a multi-phase clock formed by a DLL circuit)

[0153] Figure 14A time-domain A / D conversion module including a plurality of A / D converters according to an embodiment of the present disclosure is shown. The A / D conversion module 10 includes a DLL (delay locked loop) circuit 20, and also includes a plurality of comparators 12-1, 12-2, ..., 12-n (n is a natural number, hereinafter, without distinguishing each comparator 12) and a plurality of internal A / D converters 30-1, 30-2, . A plurality of A / D converters 14-1, 14-2, . / D converter 14).

[0154] The DLL circuit 20 includes a plurality of delay circuits 21-1, 21-2, 21-3, and 21-4 (hereinafter referred to as delay circuits 21 when the respective delay circuits are not distinguished), a phase comparator (PD) 22, a charge pump (CP) and low pass filter (LPF) 23 . Four-stage delay circuits 21 - 1 , 21 - 2 , 21 - 3 , and 21 - 4 arranged in seri...

no. 3 approach

[0165] (conversion from polyphase clock signal to Gray code)

[0166] Figure 17 An A / D conversion module according to a third embodiment of the present disclosure is shown. The A / D conversion module 90 according to the third embodiment differs from the A / D conversion module 10 according to the second embodiment in that it further includes a Gray circuit between the DLL circuit 20 and the internal A / D converter 30 Code converter 50. The same description as the second embodiment is omitted, and the parts different from the A / D conversion module 10 according to the second embodiment are described here.

[0167] The Gray code converter 50 converts the multiphase clock signal 15 input from the DLL circuit 20 from a thermometer code (thermometric code) into a Gray code, and then inputs it to a latch constituting a TDC unit of each internal A / D converter 30 Or trigger 31. By configuring in this way, the number of latches constituting the TDC can be greatly reduced, and power con...

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Abstract

Individual A / D converters constituting a time domain A / D converter group according to an embodiment of the present invention each comprises: a reference voltage selection circuit that is connected toa reference signal generation circuit for generating a first reference signal to sweep a full-scale range and a second reference signal to periodically sweep a limited voltage range a plurality of times and that switches between the first and second reference signals that are outputs of the reference signal generation circuit; a comparator that compares the first or second reference signal selected by the reference voltage selection circuit with an input signal; an internal A / D converter that implements an A / D conversion by use of a comparison output signal from the comparator; and a cumulative adder-subtracter that, if the second reference signal has been selected, outputs a signal obtained by averaging A / D conversion values obtained from the A / D conversion.

Description

technical field [0001] The present disclosure relates to a time domain A / D converter and a sensor device using the time domain A / D converter. More specifically, it relates to a time-domain A / D converter, which has: an input signal level determination part; a plurality of reference signal generation circuits, at least one of which generates a signal capable of converting The reference signal of the full-scale (Full Scale) input signal, one of the other reference voltage generation circuits generates a reference signal that periodically scans the limited voltage range multiple times and performs averaging processing; or a delay-locked loop circuit, the delay-locked loop The circuit is used to output multi-phase clocks with different timings, the multi-phase clocks are obtained by dividing the period of the main clock according to the output of the main clock, and the multi-phase clocks are used to perform A / D conversion. Furthermore, it relates to a sensor device having the tim...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H03M1/56
CPCH03M1/56H04N25/616H04N25/618H03M1/002H03M1/1225H03M1/20
Inventor 松泽昭野原正也
Owner TECH IDEA CO LTD
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