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A high-energy x-ray characterization method for nanocrystallization kinetics

A technology of nanocrystallization and kinetic characteristics, which is applied in the field of high-energy X-ray characterization of the kinetic process of nanocrystallization and the characterization of amorphous nanocrystallization characteristics, and can solve problems such as the inability to analyze the law of atomic migration and diffusion

Active Publication Date: 2022-03-04
SHANDONG JIANZHU UNIV
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Problems solved by technology

[0007] The technical problem to be solved by the present invention is to change the traditional method of analyzing the kinetic characteristics of amorphous crystallization through thermal properties, solve the problem that the traditional thermal analysis method cannot analyze the law of atomic migration and diffusion in the crystallization process, and use radiation analysis technology and The method of combining numerical simulation to obtain the atomic migration and diffusion process, the formation and growth mechanism of crystal nuclei, and the characteristics of crystallization kinetics in the process of amorphous nanocrystallization, so as to characterize the nanocrystallization process of amorphous

Method used

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  • A high-energy x-ray characterization method for nanocrystallization kinetics
  • A high-energy x-ray characterization method for nanocrystallization kinetics
  • A high-energy x-ray characterization method for nanocrystallization kinetics

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Embodiment

[0026] The test adopts the atomic percentage as Zr 40 Cu 55 Al 5 of non-crystalline.

[0027] a. Select the nominal composition as Zr 40 Cu 55 Al 5 (at.%) amorphous as the object, obtained Φ3×50mm bulk amorphous through vacuum arc melting (repeated smelting 5 times) and copper mold suction casting, and cut into Φ3×0.5mm alloy samples;

[0028] b. Place the sample in the radiation path of high-energy X-rays (wavelength 0.01nm) for ex-situ isothermal crystallization treatment, the processing temperature is 446°C, and the radiation data collection frequency is 6min to obtain ex-situ radiation data, I M (2θ), see appendix figure 1 ;

[0029] c. Correct and convert the obtained radiation data to obtain the alloy interference function I(Q) of the alloy, and perform Fourier transformation to obtain the reduced radial distribution function G(r) and radial distribution function RDF(r), etc.; calculation The nearest neighbor coordination number CN under different time conditions...

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Abstract

A high-energy X-ray characterization method for the kinetic process of nanocrystallization. Through Fourier transform and structure function derivation of radiation data, the distribution density data of atoms in nanocrystals at different time conditions are obtained, and the specific JMA equation is used for analysis. The Avrami index is obtained by segment fitting, and the crystallization kinetics analysis is performed based on this, which makes the analysis more accurate and reliable.

Description

technical field [0001] The invention belongs to the technical field of nanocrystalline material preparation, belongs to the field of amorphous technology, and relates to a technical method for characterizing the nanocrystallization characteristics of the amorphous, in particular to a high-energy X-ray characterization method for the kinetic process of nanocrystallization. Background technique [0002] Compared with crystalline materials, amorphous has long-range disorder and short-range order structure, and has a unique series of excellent mechanical, physical and chemical properties, such as high strength, high hardness, great elastic limit and viscous state at room temperature Under good formability, etc., it has broad application prospects in military, medical equipment, sports equipment and other fields. Nanocrystallization of amorphous is a promising process to obtain nanocrystalline structure materials, which greatly expands the application potential and scope of amorp...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/00G01N25/20
CPCG01N23/00G01N25/20
Inventor 徐勇徐丽丽叶佳硕商雨新胡巧玲陈可欣许超王静莹石磊
Owner SHANDONG JIANZHU UNIV
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