A method for manufacturing a grooved Schottky front silver surface metal structure

A technology of surface metal and manufacturing method, applied in semiconductor/solid-state device manufacturing, semiconductor devices, electrical components, etc., can solve the problems of difficult processing, prone to inverted triangle, need, etc., to reduce the instability of the processing process and optimize the thin film Inter-stress, the effect of reducing the manufacturing cost

Active Publication Date: 2021-10-08
TIANJIN HUANXIN TECH DEV
View PDF8 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, the following methods are mainly used to manufacture the grooved Schottky front silver surface metal structure: first, use the lift off process to perform photolithography three times, and then evaporate or sputter metal on the surface of the photoresist, and use the film to remove the metal structure. The metal on the photoresist is peeled off by the film method, the process cost is high, a special photoresist is required, and there are problems such as metal residue when the film is peeled off; the second method is to perform a photoetching on the metal surface , and then etch the metal, the etched morphology is unstable, prone to over-etching and metal residues
[0004] The following problems occurred in the actual manufacturing of the grooved Schottky front silver surface metal structure: 1. Due to the existence of the grooves and the stress between the metal films, the warpage of the wafer is too large and the processing is difficult; 2. , The composite metal film is difficult to corrode, prone to over-etching and metal residues, and the corrosion morphology is as follows figure 1 The inverted triangle phenomenon is easy to appear, which directly affects the adhesion between metal films and product reliability

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A method for manufacturing a grooved Schottky front silver surface metal structure
  • A method for manufacturing a grooved Schottky front silver surface metal structure
  • A method for manufacturing a grooved Schottky front silver surface metal structure

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0025] Firstly, the trench Schottky product sheet to be used as a potential barrier is cleaned before the barrier: the silicon wafer is cleaned with a cleaning solution with a volume ratio of HF:H2O of 20:1, and the cleaning time is 20 minutes. The surface of the chip is clean and will not affect the subsequent steps, so that the obtained barrier structure parameters are stable;

[0026] The thickness of the evaporated Ti barrier is Form a silicon wafer-Ti barrier structure. The Ti metal layer of this thickness is stable and the barrier is not prone to defects; It is an alloy of barrier metals, thereby forming a Schottky barrier and releasing stress at the same time;

[0027] The aluminum metal is then evaporated to a thickness of Form a silicon wafer-Ti barrier-aluminum metal layer structure, followed by annealing, the annealing temperature is 300-600°C, and the annealing time is 0.5-2h; Forming a silicon wafer-Ti barrier-aluminum metal layer-TiNiAg metal layer structur...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a method for manufacturing a grooved Schottky front silver surface metal structure, the method comprising the following steps: a. forming a barrier metal layer on a silicon wafer to form a silicon wafer-barrier metal structure; b. Carry out the first heat treatment to the silicon wafer-barrier metal structure; c. form the first metal layer on the barrier metal layer to form the silicon wafer-barrier metal-first metal layer structure; d. Metal - the first metal layer structure is subjected to a second heat treatment; e. Depositing a second metal layer on the first metal layer. The present invention adopts suitable metal film thickness and alloy condition, adopts metal alloying before titanium-nickel-silver, can avoid the apparent abnormality of product; The shape is stable, which is conducive to the improvement of product reliability; this process is compatible with existing conventional processes, and does not require special equipment and the introduction of new photoresists.

Description

technical field [0001] The invention relates to a front silver surface metal technology, in particular to a method for manufacturing a grooved Schottky front silver surface metal structure. Background technique [0002] Schottky barrier diodes have been used in power supply applications for decades as rectifying devices. Compared with PN junction diodes, Schottky barrier diodes have the advantages of low forward turn-on voltage and fast switching speed, which makes them very suitable for switching power supplies and high-frequency applications. [0003] Schottky barrier diodes are manufactured using the principle of a metal-semiconductor junction formed in contact between a metal and a semiconductor. Trench Schottky adopts the principle that the trench structure produces a depletion layer to pinch off the conductive channel, and its high-frequency characteristics and electrical performance are significantly better than those of the planar Schottky. At present, the followin...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/324H01L21/321H01L21/329H01L21/285H01L29/47
CPCH01L21/28537H01L21/2855H01L21/321H01L21/324H01L29/47H01L29/66143
Inventor 刘晓芳王彦君孙晨光徐长坡王万礼张新玲刘丽媛董子旭杜宏强刘闯张晋英刘文彬乔智印小松张娇
Owner TIANJIN HUANXIN TECH DEV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products