A method for manufacturing a grooved Schottky front silver surface metal structure
A technology of surface metal and manufacturing method, applied in semiconductor/solid-state device manufacturing, semiconductor devices, electrical components, etc., can solve the problems of difficult processing, prone to inverted triangle, need, etc., to reduce the instability of the processing process and optimize the thin film Inter-stress, the effect of reducing the manufacturing cost
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[0025] Firstly, the trench Schottky product sheet to be used as a potential barrier is cleaned before the barrier: the silicon wafer is cleaned with a cleaning solution with a volume ratio of HF:H2O of 20:1, and the cleaning time is 20 minutes. The surface of the chip is clean and will not affect the subsequent steps, so that the obtained barrier structure parameters are stable;
[0026] The thickness of the evaporated Ti barrier is Form a silicon wafer-Ti barrier structure. The Ti metal layer of this thickness is stable and the barrier is not prone to defects; It is an alloy of barrier metals, thereby forming a Schottky barrier and releasing stress at the same time;
[0027] The aluminum metal is then evaporated to a thickness of Form a silicon wafer-Ti barrier-aluminum metal layer structure, followed by annealing, the annealing temperature is 300-600°C, and the annealing time is 0.5-2h; Forming a silicon wafer-Ti barrier-aluminum metal layer-TiNiAg metal layer structur...
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