Device and method for detecting light-induced degradation (LID) of crystalline silicon cell

A technology of light-induced attenuation and crystalline silicon cells, applied in photovoltaic power generation, photovoltaic modules, electrical components, etc., can solve problems such as inability to monitor the production process in real time, affect production line production, and high risk of battery cells, so as to reduce the risk of unqualified , easy operation, simple steps

Inactive Publication Date: 2019-02-22
CECEP SOLAR ENERGY TECH (ZHENJIANG) CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The current conventional light attenuation detection method is to place the cell under simulated light for several hours or even dozens of hours, and use an electrical performance tester to test the efficiency before and after the light, which affects the production line and cannot realize the production process. Real-time monitoring, the risk of unqualified solar cells entering the market is high

Method used

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  • Device and method for detecting light-induced degradation (LID) of crystalline silicon cell

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Experimental program
Comparison scheme
Effect test

Embodiment 1

[0038] Please refer to figure 1 This embodiment provides a device for detecting light-induced attenuation of a crystalline silicon battery, which includes a placement platform 4, an illumination simulator 3, a heating device 5, a power source 2, and a voltmeter 1.

[0039] The placing platform 4 is used for placing the battery sheet 6. The light simulator 3 is located above the placement platform 4 and is used to perform flash test on the cell 6. The heating device 5 is located below the placing platform 4 and is used to heat the battery sheet 6 on the placing platform 4. The power source 2 is electrically connected to the battery sheet 6 through a wire for inputting current to the battery sheet 6. The voltmeter 1 is electrically connected to the battery sheet 6 through a wire, and is used to detect the voltage of the battery sheet 6.

[0040] The device for detecting light-induced attenuation of a crystalline silicon cell has a simple structure and can quickly detect whether th...

Embodiment 2

[0048] This embodiment provides a method for detecting light-induced attenuation of a crystalline silicon cell, which includes the following steps:

[0049] (1) Place the cell on the cell placement platform, and connect the electrodes on the surface of the cell with the voltmeter with wires;

[0050] (2) Turn on the light simulator to perform flash test on the cell, and record the value V1 of the voltmeter;

[0051] (3) Turn off the light simulator, heat the cell to 350°C and maintain a constant temperature;

[0052] (4) Connect the electrodes on the surface of the battery to the power supply with wires, and pass current to the battery, the current is 5A, and the pass-in time is 1min;

[0053] (5) Stop heating and stop passing current, cool the battery to room temperature, connect the surface electrode of the battery to the voltmeter with a wire, turn on the light simulator to perform a flash test on the battery, and record the voltmeter value V2;

[0054] (6) Calculate the voltage ratio...

Embodiment 3

[0056] This embodiment provides a method for detecting light-induced attenuation of a crystalline silicon cell, which includes the following steps:

[0057] (1) Place the cell on the cell placement platform, and connect the electrodes on the surface of the cell with the voltmeter with wires;

[0058] (2) Turn on the light simulator to perform flash test on the cell, and record the value V1 of the voltmeter;

[0059] (3) Turn off the light simulator, heat the cell to 400°C and maintain a constant temperature;

[0060] (4) Connect the electrodes on the surface of the battery to the power supply with wires, and pass a current to the battery. The current is 10A and the pass-through time is 1min;

[0061] (5) Stop heating and stop passing current, cool the battery to room temperature, connect the surface electrode of the battery to the voltmeter with a wire, turn on the light simulator to perform a flash test on the battery, and record the voltmeter value V2;

[0062] (6) Calculate the voltag...

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Abstract

The invention provides a device and method for detecting the light-induced degradation (LID) of a crystalline silicon cell, and relates to the technical field of crystalline silicon solar cells. The device for detecting the LID of the crystalline silicon cell comprises a placement platform, an illumination simulator, a heating device, a power source, and a voltmeter. The device is simple in structure and can quickly detect whether the LID of the crystalline silicon battery is qualified. The method for detecting the LID of the crystalline silicon cell detects the crystalline silicon cell by using the device for detecting the LID of the crystalline silicon cell. The method can quickly detect whether the LID of the crystalline silicon battery is qualified by one device, does not need a battery cell efficiency tester, does not affect the production of a production line, has simple steps and is convenient to operate, thereby realizing a purpose of monitoring the LID of a battery cell in real time and reducing a risk of qualified battery cell LID in batches.

Description

Technical field [0001] The present invention relates to the technical field of crystalline silicon solar cell manufacturing, in particular to a device and method for detecting light-induced attenuation of a crystalline silicon cell. Background technique [0002] P-type crystalline silicon cells will experience a decrease in efficiency after exposure to light. This phenomenon is called light-induced attenuation, which additionally increases the power loss of solar cells and components. With the development of high-efficiency technology, the efficiency of crystalline silicon solar cells is getting higher and higher, and the influence of light decay on solar cells is also increasing. In order to prevent cells with unqualified light decay from entering the market, it is necessary to test the light decay during the production of the cells. At present, the conventional light decay detection method is to place the cell under simulated light for several hours or even dozens of hours, an...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H02S50/15
CPCH02S50/15Y02E10/50
Inventor 黄惜惜周肃黄青松贾佳邱家梁张鑫义勾宪芳黄国平张会学明杰陈中一
Owner CECEP SOLAR ENERGY TECH (ZHENJIANG) CO LTD
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