High-frequency magnetic spectrograph

Abstract

The invention relates to the field of material surface magnetism measurement. A high-frequency magnetic spectrograph comprises a pulse laser, a time delayer, a 1 / 4 wave plate, a concave lens, a firstconvex lens, a plane mirror, a polaroid, a beam splitter, a second convex lens, a lens table, a first atomic force microscope, a first probe, a lens seat, an objective lens, a sample, a wave guide, asample table, a signal generator, an oscilloscope, a detector, a bias three-way valve, a first amplifier, a frequency mixer, a second amplifier, an analog-digital converter, a computer, a second atomic force microscope, a second probe and a phase sensitive detector. A single nanometer structure can be measured; the measurement on the magnetization dynamic state of the sample surface has the spaceresolution ratio of the submicron grade; the magnetization information on the nanometer scale sample surface is obtained by using a high-precision positioning device; two different atomic force microscope needle points are used for respectively performing contact mode atomic force microscope scanning and near field time resolution Magneto-Optical Kerr effect experiments; a frequency domain methodis used for detecting the GHz frequency band magnetization dynamic states on the surface of the sample.

Description

technical field [0001] The invention relates to the field of material surface magnetic measurement, in particular to a high-frequency magnetic spectrometer capable of measuring the high-frequency dynamic magnetization of a single nanostructure on the material surface. Background technique [0002] The magneto-optical Kerr effect measurement device is an important means in the study of material surface magnetism. Its working principle is based on the magneto-optic Kerr effect caused by the interaction between light and magnetized media. Magnetic detection, and non-contact measurement can be realized, and it has important applications in the research of magnetic order, magnetic anisotropy, interlayer coupling and phase transition behavior of magnetic ultrathin films. The magneto-optical Kerr effect measurement device mainly detects the magnetization observation of the sample surface by detecting the change of the polarization state of a beam of linearly polarized light after i...

AI Technical Summary

Problems solved by technology

The magneto-optical Kerr effect measurement device mainly detects the magnetization observation of the sample surface by detecting the change of the polarization state of a beam of linearly polarized light after it is reflected on the surface of the material. Therefore, the imaging effect is easily limited by the optical elements. Technical defect 1: The spatial resolution of the traditional focusing Kerr microscope using microscope objective lens is determined by the optical diffraction limit, so it is impossible to obtain the dynamic characteristics of magnetization at the nanometer scale; the existing technical defect 2: it is impossible to obtain higher frequency magnetization in the sample. Magnetization dynamic information, the high-frequency magnetic spectrometer can solve the problem

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