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Testing method for dielectric property of liquid sample in high-pressure condition

A technology for liquid samples and dielectric properties. It is applied in the direction of dielectric property measurement, measurement of electricity, and measurement devices. It can solve problems such as temperature uncertainty and difficulty in estimating the effective electrode area, so as to reduce waste, isolate heat conduction, and structure simple effect

Pending Publication Date: 2018-03-30
JINHUA VOCATIONAL TECH COLLEGE
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The difficulty in the prior art is that under different pressure conditions, the effective area and the distance between the electrodes are variable. In addition, due to the deformation of the gasket, it is especially difficult to estimate the effective electrode area. When using the parallel plate capacitance method to measure the dielectric properties of materials In a constant experiment, the electrode area or the distance between the electrode plates must be kept constant under the pressure of the anvil in order to achieve the effect of accurate measurement
In addition, in the experiment of measuring the temperature dependence of the sample under high pressure conditions, the defect of the prior art is that the uncertainty of the temperature of the sample always exists due to different anvil configurations or special experimental purposes.

Method used

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  • Testing method for dielectric property of liquid sample in high-pressure condition
  • Testing method for dielectric property of liquid sample in high-pressure condition
  • Testing method for dielectric property of liquid sample in high-pressure condition

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Embodiment Construction

[0019] Such as figure 1 It is a schematic diagram of the structure of the present invention, such as figure 2 yes figure 1The top view schematic diagram, the device mainly includes screw rod I (1), support frame I (2), screw rod II (3), support frame II (4), support screw (5), piston part (6), lower anvil (7 -1), upper anvil (7-2), cylinder part (8), screw rod III (9), screw rod IV (10), optical fiber (11), current lead I (12), current lead II (13) , epoxy resin and diamond particle mixture (14), open common film (15), copper foil (16), indium gasket (17), Teflon gasket (18), sample, current lead III, current lead IV, current Lead V, current lead VI, dielectric constant measuring instrument, lock-in amplifier I, lock-in amplifier II, computer, the sample includes sample I (19-1) and sample II (19-2), and the support frame I (2) and support frame II (4) are all made up of upper support plate, lower support plate, connecting rod respectively, and the upper support plate and ...

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Abstract

The invention relates to a method for testing the dielectric properties of liquid samples under high-pressure conditions for high-pressure physical property measurement. Before introducing liquid samples, use water as a calibration sample to calibrate the pressure of the device at room temperature, and put them into two holes of the Teflon gasket respectively. Ruby ball, pressure measurement by ruby ​​fluorescence method; place the anvil in the compaction device, turn the screw I slightly to seal the indium gasket between the contact surfaces of the upper anvil and the lower anvil, record the pressure in the anvil and the screw The relationship between the rotation angle of I; introduce the liquid sample, and rotate the screw I to apply pressure to the anvil; measure the dielectric constant of the sample by the parallel plate capacitor method: connect the current lead I and the current lead II to the dielectric constant measuring instrument respectively, Record the dielectric constant of the sample under various anvil pressure conditions; measure the AC resistance of the sample: sample I is connected to the lock-in amplifier I through the current lead III and the current lead IV, and the sample II is connected to the lock-in amplifier II through the current lead V and the current lead VI .

Description

technical field [0001] The invention relates to the field of high-voltage physical property measurement, which is a method for testing the dielectric properties of liquid samples under high-voltage conditions by using a device with double sample chambers in the same gasket and capable of simultaneously measuring the transport characteristics of two samples. Background technique [0002] The anvil is currently the only scientific experimental device that can generate a static pressure of more than one million atmospheres. It is irreplaceable in high-pressure scientific research. The high-hardness material squeezes the sample mechanically to generate a high-pressure environment. A metal gasket with a sample hole pre-processed is placed between the extrusion surfaces formed by the two table tops, and the sample is placed in the sample hole. During the experiment, the pressure on the sample needs to be monitored. At present, the general pressure test method usually uses the meth...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/26G01R31/00
CPCG01R27/2617G01R31/00
Inventor 张向平贾冬玲潘天娟
Owner JINHUA VOCATIONAL TECH COLLEGE
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