Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A light-emitting diode with a resonant tunneling structure electron blocking layer

A technology of light emitting diodes and structural electronics, applied in circuits, electrical components, semiconductor devices, etc., can solve the problems of low carrier recombination efficiency and luminous efficiency of LED devices, and achieve good electron blocking effect, simple growth method, high altitude The effect of hole injection efficiency

Active Publication Date: 2019-03-29
SOUTHEAST UNIV
View PDF3 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, these electron blocking layers still cannot satisfactorily solve the biggest technical problem: the more obvious the blocking effect of the p-type electron blocking layer on electron leakage, the greater the drop in hole injection efficiency, thus leading to the carrier recombination of LED devices. Efficiency and luminous efficiency are still low

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A light-emitting diode with a resonant tunneling structure electron blocking layer
  • A light-emitting diode with a resonant tunneling structure electron blocking layer
  • A light-emitting diode with a resonant tunneling structure electron blocking layer

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0019] like figure 1 As shown, a light-emitting diode with a resonant tunneling structure electron blocking layer includes: an m-plane sapphire substrate 101, an n-type AlGaN layer 102, an AlGaN / AlN multiple quantum well layer 103, a resonant tunneling Through-structure electron blocking layer 104, p-type AlGaN layer 105, ITO ohmic contact layer 106, the Ti metal layer provided on the n-type AlGaN layer serves as the n-type electrode 107 and the Ni / Ag alloy provided on the p-type AlGaN layer The layer is used as the p-type electrode 108 , wherein the electron blocking layer 104 is composed of a p-type doped AlGaN barrier layer 1041 , an undoped AlGaN well layer 1042 , and an undoped AlGaN barrier layer 1043 . The electron blocking layer can effectively prevent electrons from passing through the multi-quantum well layer 103 and entering the p-type region, thereby reducing leakage current and facilitating injection of holes into the multi-quantum well layer 103 .

[0020] The ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a light emitting diode with an electron blocking layer in a resonant tunneling structure. The light emitting diode comprises a substrate, an n-type nitride layer, a multiple quantum well layer, the electron blocking layer, a p-type nitride layer and a p-type nitride ohmic contact layer, an n-type electrode which is arranged on the n-type nitride layer, and a p-type electrode which is arranged on the p-type nitride layer, wherein the substrate, the n-type nitride layer, the multiple quantum well layer, the electron blocking layer, the p-type nitride layer and the p-type nitride ohmic contact layer are arranged in order from the bottom up. The electron blocking layer is composed of a p-type doped nitride barrier layer, a non-doped nitride potential well layer, and a non-doped barrier layer which increases the hole transmittance through a resonance tunneling effect, wherein the p-type doped nitride barrier layer, the non-doped nitride potential well layer and the non-doped barrier layer are arranged in order from bottom to top. The light emitting diode provided by the invention has the advantages that electrons are effectively prevented from passing through an active region into a p-type region, which increases the injection efficiency of a hole into the active region through the electron blocking layer; a good electronic blocking effect is realized through a simple growth mode and less layer structures; and the hole injection efficiency significantly higher than a traditional electronic blocking layer structure is acquired.

Description

technical field [0001] The present invention relates to the technical field of manufacture of compound semiconductor optoelectronic materials and devices, in particular to a light emitting diode with an electron blocking layer of a resonant tunneling structure. Background technique [0002] LED has attracted much attention due to its high efficiency, energy saving, small size, long life and other advantages, and has begun to gradually replace traditional lighting methods such as fluorescent lamps and incandescent lamps. However, the rapid decline of the internal quantum efficiency of LEDs under high current injection conditions severely restricts the application and development of LEDs. The existence of leakage current is considered to be a major factor leading to the decline of LED efficiency under high current density conditions. Therefore, reducing leakage current is of great significance for improving the luminous efficiency of LEDs. [0003] Since electrons have a smal...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L33/14
CPCH01L33/14
Inventor 张雄杨刚代倩崔一平
Owner SOUTHEAST UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products