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Etching liquid for silicon system multilayer films

A multi-layer film, etching solution technology, applied in the direction of surface etching compositions, chemical instruments and methods, can solve the problem that the etching speed of the silicon nitride layer and the silicon oxide layer are basically the same, and it is difficult to meet the requirements of the thin film transistor processing technology. and other problems, to achieve the effect of fast etching speed, improved wettability and etching uniformity, and smooth etching surface

Active Publication Date: 2017-06-16
ZHEJIANG KAISN FLUOROCHEM
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

But in order to make the etching rate of silicon nitride layer and silicon oxide layer substantially consistent, the addition of above-mentioned ethylene glycol or propylene glycol must be more than 30% (w / w), and the etching rate of silicon nitride layer and silicon oxide layer is only It is difficult to meet the processing requirements of thin film transistors
Moreover, the addition of surfactants can only improve the surface tension of the etching solution and improve the uniformity of etching, but cannot make the etching speed of the silicon nitride layer and the silicon oxide layer basically the same.

Method used

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  • Etching liquid for silicon system multilayer films
  • Etching liquid for silicon system multilayer films
  • Etching liquid for silicon system multilayer films

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0029] The components and mass percentages of the etchant for silicon-based multilayer films are:

[0030]

[0031] Pyrimidine and its derivatives are cytosine, and the resistivity of the ultrapure water at 25°C is not less than 18 megohms.

Embodiment 2

[0033] The components and mass percentages of the etchant for silicon-based multilayer films are:

[0034]

[0035] Pyrimidine and its derivatives are uracil, and the resistivity of the ultrapure water at 25°C is not less than 18 megohms.

Embodiment 3

[0037] The components and mass percentages of the etchant for silicon-based multilayer films are:

[0038]

[0039]

[0040] The pyrimidine and its derivatives are 5-fluorocytosine, and the resistivity of the ultrapure water at 25° C. is not lower than 18 megohms.

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PUM

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Abstract

The invention discloses an etching liquid for silicon system multilayer films. The etching liquid comprises a hydrofluoric acid solution, an ammonium fluoride solution, a surfactant and a compound represented by a general formula shown in the description; and in the formula, R1 is one of an amino group, hydrogen, oxygen and a hydroxyl group, and R2 is one of fluorine, chlorine, hydrogen, a hydroxyl group and a C1-C4 alkyl group. The etching liquid for silicon system multilayer films allows the etching speed of a silicon nitride layer to basically same to the etching speed of a silicon oxide layer, and has a good etching effect.

Description

technical field [0001] The invention relates to the technical field of etching an insulating layer of a polysilicon thin film transistor, and more specifically relates to an etchant for a silicon-based multilayer thin film. Background technique [0002] At present, the low-temperature polysilicon thin-film transistor (LTPS TFT-LCD) of liquid crystal display has been developed and is increasingly mass-produced. The layer is a silicon oxide film. For the processing technology of this structure, using hydrofluoric acid or BOE (buffered oxide etchant, the main components are hydrofluoric acid, ammonium fluoride and water) wet etching is an important step in the preparation of high-performance thin film transistors. [0003] The low-temperature polysilicon thin film transistor insulating layer etching process is divided into two steps. The first step is to remove the ILD layer and part of the GI silicon oxide layer by dry etching, and the remaining GI silicon oxide layer is remo...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): C09K13/08
CPCC09K13/08
Inventor 王海田志扬赵晓亚曹文兵袁野曾朵清卢振成
Owner ZHEJIANG KAISN FLUOROCHEM
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