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Testing device and method for near-field wave-absorbing material reflectivity

A technology of microwave-absorbing materials and testing devices, which is applied to measuring devices, using microwave means for material analysis, analyzing materials, etc., can solve problems such as large differences in test conditions, inability to test reflectivity, and large microwave anechoic chamber, etc., to achieve test results Good, low test condition requirements, low cost effect

Inactive Publication Date: 2016-09-21
HENGDIAN GRP DMEGC MAGNETICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the bow method also has its own shortcomings and limitations: 1. The bow method test is a kind of free space method. In order to avoid the interference of external electromagnetic waves on the test, it needs to be tested in a standard microwave anechoic chamber. Place a large number of absorbing materials to eliminate external electromagnetic waves
Therefore, the bow method test requires a higher cost
2. The angle between the transmitting antenna and the receiving antenna and the sample surface is theoretically required to be the same, but in the actual test process, it is difficult to locate accurately, which eventually leads to large measurement errors
3. The bow method is mainly used to test the performance of far-field radar absorbing materials, which is more suitable for the military industry, such as testing stealth coatings, structural stealth materials, etc., while for near-field absorbing materials (such as absorbing materials used in electronic equipment Thin sheet material) is not suitable, mainly because such materials are usually attached to the surface of components, and the use environment is quite different from the test conditions of the bow method
In the actual test process, due to the limitation of the site and cost, it is difficult for the microwave anechoic chamber to be very large.
Generally, the test frequency of the bow method is above 1GHz, and it is usually impossible to test the reflectivity of materials in the frequency band below 1GHz.

Method used

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  • Testing device and method for near-field wave-absorbing material reflectivity

Examples

Experimental program
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Effect test

Embodiment 1

[0037] Such as Figure 1~3 As shown, a test device for the reflectivity of near-field absorbing materials includes a vector network analyzer. The vector network analyzer is connected to the coaxial flange fixture through a coaxial cable. The coaxial flange fixture is placed on the bracket. An isolation plate is provided on the top of the flange fixture, and the sample placement part is between the isolation plate and the coaxial flange fixture.

[0038] The vector network analyzer in this embodiment has two ports; the coaxial flange fixture includes a fixture body, the fixture body is in a cylindrical "T" shape structure, the middle of the fixture body is an inner conductor, and the surroundings of the inner conductor are hollow structures; the inner conductor is Lower fine upper coarse structure.

[0039]There is a through hole in the middle of the bracket in this embodiment, and the lower part of the fixture body is fixed through the through hole; the lower extension part i...

Embodiment 2

[0053] The vector network analyzer Keysight N5232A is selected, the frequency range is 300kHz-20GHz, including two ports, and the lower part of the flange device of Dingrong Electronics DR-S01 shielding effectiveness test device (in accordance with GB / T 25471-2010 standard) is modified to Coaxial flange fixture, D0=133mm, the isolation plate is made of brass, the surface is smooth without scratches, the specific dimensions are:

[0054] D2=134mm

[0055] D1=154mm

[0056] h2=25mm

[0057] h1=35mm

[0058] After testing, the voltage standing wave ratio of the system in the range of 30MHz-3GHz is less than 1.8, and the insertion loss is less than 0.3dB. The sample to be tested is a flexible wave-absorbing sheet material composed of polymer material and soft magnetic alloy powder, with a thickness of 0.5±0.02mm , the material is uniform, indicating flatness.

[0059] Use this system to measure the reflectivity of materials, the measurement frequency range is 30MHz-3GHz, the s...

Embodiment 3

[0064] The vector network analyzer Keysight N5232A is selected, the frequency range is 300kHz-20GHz, including two ports, and the lower part of the flange device of Dingrong Electronics DR-S01 shielding effectiveness test device (in accordance with GB / T 25471-2010 standard) is modified to Coaxial flange fixture, D0=133mm, the material of the isolation plate is brass, indicating that it is gold-plated, the thickness of the coating is 1.5mm, the surface is smooth without scratches, and the specific dimensions are:

[0065] D2=133.5mm

[0066] D1=143.5mm

[0067] h2=20mm

[0068] h1=25mm

[0069] After testing, the voltage standing wave ratio of the system in the range of 30MHz-3GHz is less than 1.8, and the insertion loss is less than 0.3dB. The sample to be tested is a flexible wave-absorbing sheet material composed of polymer material and soft magnetic alloy powder, with a thickness of 0.5±0.02mm , the material is uniform, indicating flatness.

[0070] Use this system to m...

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Abstract

The invention discloses a testing device for near-field wave-absorbing material reflectivity. The device comprises a vector network analyzer which is connected with a coaxial flange clamp through a coaxial cable, the coaxial flange clamp is arranged on a support, a division board is arranged on the top of the coaxial flange clamp, and a sample placing part is arranged between the division board and the coaxial flange clamp. The invention further discloses a testing method of the testing device for the near-field wave-absorbing material reflectivity. The testing device for the near-field wave-absorbing material reflectivity has the advantages that the structure is simple, the manufacturing cost is low, low-frequency range (30 MHz-3 GHz) measurement can be achieved, operation is easy and convenient, the accuracy degree is high, and the repeatability is good.

Description

technical field [0001] The invention relates to material testing technology, in particular to a test device and a test method for the reflectivity of near-field wave-absorbing materials. Background technique [0002] Absorbing materials are a class of functional materials that can convert electromagnetic energy into heat or other forms of energy. They were first used in the military field, such as stealth fighters and stealth equipment. In recent years, with the rapid development of electronic information technology, electronic products are developing in the direction of miniaturization, integration and functionalization, and the problems of electromagnetic interference and electromagnetic radiation pollution are becoming more and more prominent. Civilian microwave-absorbing materials (such as sheets and films) can solve the above problems to a certain extent, and the market demand is increasing. [0003] Absorbing materials have important applications in both military and ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N22/00
CPCG01N22/00
Inventor 刘立东叶怡婷郝斌刘克霞
Owner HENGDIAN GRP DMEGC MAGNETICS CO LTD
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