Low-voltage transparent oxide thin film transistor and preparation method thereof
A transparent oxide and thin-film transistor technology, which is applied in transistors, semiconductor/solid-state device manufacturing, circuits, etc., can solve the problem of inability to meet the requirements of large-screen display for process uniformity and consistency, complex p-SiTFT process, opaque LTPSTFT, etc. Problems, achieve the effect of improving device mobility, low price, and good transparency
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Embodiment 1
[0046] The low-voltage transparent oxide thin film transistor of this embodiment has a bottom-gate and top-electrode structure, such as figure 1 As shown, from bottom to top include:
[0047] The substrate 1 is ITO conductive glass; the upper conductive film of the ITO conductive glass is an ITO gate electrode 2;
[0048] The gate electrode insulating layer 3 is transparent ZrO 2 a film located on the ITO gate electrode 2;
[0049] The active layer 4 is a transparent oxide film located on the gate electrode insulating layer 3;
[0050] The source electrode 5 and the drain electrode 6 are both transparent tin oxide doped indium oxide (ITO) films, and are respectively located on the active layer 4 .
[0051] Wherein, the transparent oxide film is an indium-doped zinc oxide (InZnO) film; in the transparent oxide film, the mass percentage of indium is 3%; the transparent ITO (tin oxide-doped indium oxide) film Among them, the mass ratio of indium oxide to tin oxide is 90:10. ...
Embodiment 2
[0066] The low-voltage transparent oxide thin film transistor of this embodiment has a bottom-gate and top-electrode structure (the structure is the same as that of Embodiment 1), and sequentially includes from bottom to top:
[0067] The substrate is ITO conductive glass; the upper conductive film of the ITO conductive glass is an ITO grid electrode;
[0068] Gate electrode insulating layer, transparent ZrO 2 a film on the ITO gate electrode;
[0069] an active layer, which is a transparent oxide film, located on the gate electrode insulating layer;
[0070] The source electrode and the drain electrode are both transparent tin oxide doped indium oxide (ITO) films, respectively located on the active layer.
[0071] Wherein, the transparent oxide film is a titanium doped zinc oxide (TiZnO) film; in the transparent oxide film, the mass percentage of titanium is 1%; the transparent ITO (tin oxide doped indium oxide) film Among them, the mass ratio of indium oxide to tin oxide ...
Embodiment 3
[0086] The low-voltage transparent oxide thin film transistor of this embodiment has a bottom-gate and top-electrode structure (the structure is the same as that of Embodiment 1), and sequentially includes from bottom to top:
[0087] The substrate is ITO conductive glass; the upper conductive film of the ITO conductive glass is an ITO gate electrode;
[0088] Gate electrode insulating layer, transparent ZrO 2 a film on the ITO gate electrode;
[0089] an active layer, which is a transparent oxide film, located on the gate electrode insulating layer;
[0090] The source electrode and the drain electrode are both transparent tin oxide doped indium oxide (ITO) films, respectively located on the active layer.
[0091] Wherein, the transparent oxide film is gallium doped zinc oxide (GaZnO) film; in the transparent oxide film, the mass percentage of gallium is 5%; the transparent ITO (tin oxide doped indium oxide) film Among them, the mass ratio of indium oxide to tin oxide is 9...
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