Method for producing straightly-pulled heavily-doped ultralow-resistivity silicon monocrystal
A very low resistance, silicon single crystal technology, applied in the direction of single crystal growth, single crystal growth, chemical instruments and methods, etc. The resistivity of single crystal is not involved, so as to reduce the cost of single crystal, reduce the probability of bad loss, and reduce the resistivity of single crystal silicon
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Embodiment 1
[0022] Material requirements: 5-inch crystal direction, low resistance and heavily doped with arsenic, resistivity requirement: 0.002-0.003Ω.cm;
[0023] The steps are: after dismantling and cleaning the furnace, put heavily arsenic-doped single crystal tailings (resistivity 0.003) as raw materials into a quartz crucible, and other evacuation and chemical materials are carried out according to the normal procedure of Czochralski silicon; when doping, press Doping with 5g / kg, switching the blast furnace pressure parameters (executed at 30torr higher than the crystal pulling furnace pressure) during doping, baking for 1 hour, and then stabilizing the temperature for 1.5 hours to start the crystal pulling step: stabilizing temperature - seeding - shoulder expansion -Keep. When the crystal remains stable, gradually increase the furnace pressure to 35torr-100torr until the equal-diameter growth is completed, and then stop the furnace at the end. The resistivity of the obtained si...
Embodiment 2
[0025] Material requirements: 5-inch crystal direction, low resistance and heavily doped with antimony, resistivity requirement: 0.007-0.014Ω.cm
[0026] The steps are: after the furnace is disassembled, the primary polycrystalline material and the heavily antimony-doped single crystal tailing (resistivity 0.025) are used as raw materials in a ratio of 1:1, and put into a quartz crucible, and other evacuated and chemical materials are used as Czochralski. Silicon is carried out in the normal procedure; when doping, the doping is carried out according to the doping 6g / kg, and the blast furnace pressure parameter (executed at 40 torr higher than the crystal pulling furnace pressure) is switched to bake for 3 hours during doping, and then the temperature is stabilized for 2 hours, when the temperature After stabilization, start the steps of temperature stabilization crystal pulling: temperature stabilization - seeding - shoulder expansion - maintenance. When the crystal remains ...
Embodiment 3
[0028] Material requirements: 6-inch grain heavily doped with phosphorus, resistivity requirement 0.0008-0.0016Ω.cm
[0029] The steps are: after the furnace is disassembled, the primary polycrystalline material and the heavily phosphorus-doped single crystal tailing (resistivity 0.002) are used as raw materials in a ratio of 1:1, and put into a quartz crucible. Silicon is carried out in the normal procedure; when doping, the doping is carried out according to the doping 4g / kg, and the blast furnace pressure parameter (executed at 40 torr higher than the crystal pulling furnace pressure) is switched to bake for 2 hours during doping, and then the temperature is stabilized for 1 hour, and the temperature is stabilized During the process, the argon gas is changed to a mixed gas of argon and phosphine (phosphine volume fraction 0.001%), and when the temperature is stable, the temperature-stabilized crystal pulling step is started: temperature stabilization-seeding-shoulder expans...
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