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Solid sample direct introduction device of microwave plasma torch spectrometer

A microwave plasma and sampling device technology, applied in the direction of material excitation analysis, thermal excitation analysis, etc., can solve the problems of high water content in samples, slow speed, large energy and time consumption, etc., and achieve low material state requirements and reasonable device design , The effect of facilitating user needs

Active Publication Date: 2015-07-22
ZHEJIANG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although it can digest most biological samples, it has the following disadvantages: 1. Time-consuming and labor-intensive, requiring a lot of energy and time; 2. The sample contains a lot of water, which cannot be directly injected into most instruments; 3. The processing process is complicated, Due to the particularity of biological samples, the digestion process is more complicated and other issues
In comparison, the steps of electrothermal evaporation and suspension sampling are cumbersome and slow, while arc spark sampling is mainly aimed at the analysis of conductive substances, and cannot provide an effective processing and sampling method for biological samples.

Method used

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  • Solid sample direct introduction device of microwave plasma torch spectrometer
  • Solid sample direct introduction device of microwave plasma torch spectrometer

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Experimental program
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Embodiment 1

[0025]The present invention consists of a pulsed laser system, an imaging positioning system, a sample processing system, a position adjustment system and a gas path transfer system, specifically consisting of a laser 1, an imaging camera 2, a front optical path group 3, a dichroic mirror 4, and a laser focusing mirror 5 , sample skylight 6, sample rack 7, position adjustment system 8, sample cell 9, helium (or other inert gas) transfer line 10, aerosol transfer line, MPT ion source system 11, MPT ion source system 12, control Computer 13 is formed. The laser beam emitted by the laser 1 is focused on the surface of the sample 13 through optical path adjustment to form an aerosol, which is blown into the aerosol transfer line 11 by helium (or other inert gas) and connected to the MPT; the sample cell 9 is connected to the MPT through the aerosol transfer port 11 The MPT torch 12 of the ion source system is connected.

[0026] attached by figure 1 It can be seen that a sol...

Embodiment 2

[0037] With the device of the present invention, the specific solid sample direct sampling operation steps are as follows:

[0038] 1. Determine the solid sample analysis area

[0039] The sample is moved by the position adjustment system 8 to be imaged in the positioning imaging system, and the movement of the sample 13 is adjusted to determine its position.

[0040] 2. Sampling parameter setting

[0041] The exposure time and focus position of the imaging camera 2 are controlled by the control computer 13, and the laser energy and focus position of the laser are set at the same time.

[0042] 3. Set the gas state of the carrier gas helium (or other inert gas)

[0043] Set the gas flow rate and pressure of helium (or other inert gas), and then bring the solid sample aerosol formed after laser ablation into the MPT torch of the MPT ion source system.

[0044] 4. Sample ablation, status monitoring

[0045] After the laser is focused on the surface of the sample to form an a...

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Abstract

The invention provides a solid sample direct introduction device of a microwave plasma torch spectrometer. The solid sample direct introduction device mainly includes pulsed laser system, an imaging positioning system, a sample processing system, a position regulating system and an air path switching system. Through the adoption of the solid sample direct introduction device disclosed by the invention, the direct sampling analysis of solid samples comprising biological samples, metallic materials and the like can be realized, besides, the device is suitable for sampling regular sample surfaces and irregular sample surfaces, direct laser ablation sampling can atomize all the elements, and the device can be used for full elementary analysis of the microwave plasma torch spectrometer. The device can be applied to many existing fields of metallurgy, medical inspection, life science, agriculture, food safety detection, forestry, environmental monitoring, biological identification, medicolegal expertise and the like. The device disclosed by the invention is reasonable in design, and can be used for direct sample introduction for the solid samples, the pretreatment steps of the samples are decreased, requirements for the material state of the samples are lower, and the device satisfies user demands.

Description

technical field [0001] The invention belongs to the technical field of solid material characterization and analysis, and in particular provides a solid sample direct sampling device for a microwave plasma torch spectrometer, and mainly relates to a device for analyzing the surface and internal element components of a solid material. Background technique [0002] Commonly used solid material analysis often adopts sample grinding and dissolution, solution atomization and sample injection for analysis, including the detection of biological samples, ores, metals and other samples must be pre-treated before performance analysis can be performed. However, there are various pretreatment methods and most of them are relatively complicated. The present invention combines the existing technology and the microwave plasma torch technology to propose a device design for direct sampling of solid samples. The biological sample is used as an example to illustrate, and it is also applicable ...

Claims

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Application Information

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IPC IPC(8): G01N21/73
Inventor 金伟应仰威牟颖金钦汉
Owner ZHEJIANG UNIV
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