Fault diagnosis method of switching current circuit

Abstract

The invention discloses a fault diagnosis method of a switching current circuit. The fault diagnosis method comprises the steps of: first, carrying out sensitivity analysis on components of the switching current circuit, setting the fault types and collecting fault information; then, carrying out pre-processing on the acquired information to acquire a dimensionality reduction characteristic vector and a cloud model digital characteristic value; optimizing a wavelet neural network structure weight value and a threshold value by adopting a fish swarm algorithm; and finally, carrying out diagnostic analysis on parameter data to acquire the fault type. Through adopting the fault diagnosis method, the mode of data processing is more reasonable, the network structure is more stable, the diagnosis accuracy is higher, and the convergence rate is higher.

Description

technical field [0001] The invention relates to a fault diagnosis method for a switching current circuit, in particular to a fault diagnosis method for a switching current circuit based on a cloud model and an intelligent group algorithm. Background technique [0002] The switched capacitor circuit based on the double-layer polysilicon process has high requirements for circuit excitation and needs nonlinear floating capacitor support, while the switched current element is based on the gate oxide capacitor current stored in the open state of the MOS transistor to maintain the drain current, which is relatively reduced. It eliminates the dependence on capacitance, thus achieving compatibility with digital CMOS process circuits. [0003] With the development of large-scale integrated circuits, the advantages of low-voltage and low-power characteristics of switching current circuits are increasingly revealed and initially developed; soft fault diagnosis outside the tolerance ran...

AI Technical Summary

Problems solved by technology

[0004] In recent years, researchers have made a lot of achievements in the fault diagnosis of analog technology in digital technology, such as fault diagnosis of switching current circuit by neural network, fault diagnosis of switching current circuit by genetic algorithm, etc., but these diagnostic methods only aim at solving Specific issues, unsatisfactory results

So far, few literatures have proposed to solve the problem of data conversion between qualitative and quantitative data of switching current circuits

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