Polishing solution for precision polishing of LED sapphire substrate
A precision polishing and polishing liquid technology, applied in the field of polishing liquid, can solve the problems of heavy scratches on the surface of the wafer, high processing cost, and large roughness of the polishing surface, etc., and achieve high removal rate, consistent removal rate, and good fluidity
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[0052] Implementation example results:
[0053] example Silica sol concentration Viscosity at room temperature removal rate Surface roughness Example 1 10~20wt% 0.75~0.85mm2 / s 12.6nm / min Ra: 4.73nm Example 2 20~35wt% 0.85~1.0mm2 / s 15.8nm / min Ra: 1.66nm
[0054] Example results 20~30wt% silica sol abrasive, the removal rate is high, and the surface quality is relatively good.
[0055] Conclusion: The sol abrasive with a particle size of 50-70nm and a content of 20-30wt% is more suitable as the abrasive for the sapphire polishing solution of the present invention. Its viscosity at room temperature is 0.80-1.1 mm2 / s which is close to the required value, and its fluidity is good.
[0056] 2. Example of adjusting the pH value of the polishing solution
[0057] First dissolve the selected three organic bases in a certain amount of deionized water, stir well, then slowly add silica sol and stir well, add each test solution to the speci...
example 13
[0082] The organic base diethanolamine is a silica sol with a content of 0.7-1.0 wt%, a particle size of 50-70nm and a content of 25-35 wt%, the content of ethylenediamine as a dispersant is 0.4-0.7 wt%, and the content of nonylphenol polyoxyethylene ether as an active agent is 0.1 ~0.3 wt%. Through verification experiments, it is found that the final removal rate of polishing fluid can reach about 28nm / min, the surface roughness Ra is less than 0.5nm, and other main performance indicators can also meet the requirements.
[0083] Compared with imported polishing fluid performance:
[0084] Metrics and Performance import self-provided PH value 9~10 9~12 viscosity 0.6~1.0mm2 / s 0.80~1.1mm2 / s Dispersant - Ethylenediamine active agent - Nonylphenol polyoxyethylene Abrasive content (wt%) 20~25 30~60 Removal rate >17nm / min >28nm / min Surface roughness 0.1~0.3nm Flatness
[0085] It can be see...
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