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Overvoltage comparison circuit
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A technology of comparing circuits and overvoltages, applied in the measurement of electrical variables, current/voltage, measurement devices, etc., can solve the problems of not meeting the needs of use, wasting chip area, etc., and achieve the effect of reducing consumption area and manufacturing cost.
Active Publication Date: 2011-08-31
SHANGHAI BEILING
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Problems solved by technology
However, the biggest disadvantage of the above-mentioned circuit structure is that it will waste a lot of chip area, so it is increasingly unable to meet the needs of use.
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[0016] Such as figure 2 As shown, the present invention, that is, an overvoltage comparison circuit, includes an inverter INV and first to fifth branches 1 to 5 respectively connected in parallel between an external power supply VDD and ground, wherein:
[0017] The first branch 1 includes a current source I0 and a first low-voltage device M1 connected in series, and the gate of the first low-voltage device M1 is connected to the drain, and its source is grounded;
[0018] The second branch circuit 2 includes a first high-voltage device M21 and a second low-voltage device M2 connected in series, wherein the source of the second low-voltage device M2 is grounded, its gate is connected to the gate of the first low-voltage device M1, and the first high-voltage device M2 The gate of the device M21 is connected to the external power supply VDD, and a second high-voltage device M22 is connected in series between its drain and an external signal source FB to be tested. The source of...
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Abstract
The invention relates to an overvoltage comparison circuit, which comprises a reverser, a first branch circuit, a second branch circuit, a third branch circuit, a fourth branch circuit and a fifth branch circuit, wherein the first branch circuit, the second branch circuit, the third branch circuit, the fourth branch circuit and the fifth branch circuit are respectively connected in parallel between an external power supply and the ground, the first branch circuit comprises a first current source and a first low-voltage device which are in series connection, in addition, a grid electrode and adrain electrode of the first low-voltage device are connected, the second branch circuit comprises a first high-voltage device and a second low-voltage device which are in serial connection, a grid electrode of the second low-voltage device is connected with the grid electrode of the first low-voltage device, in addition, a second high-voltage device is connected in series between the first high-voltage device and an external signal source to be detected, and a grid electrode and a drain electrode of the second high-voltage device are connected. The invention utilizes the conduction and shut-off feathers of the high-voltage devices and the low-voltage devices to realize the comparison of the high-voltage signals and the power supply voltage, i.e. the overvoltage comparison function, at the same time, because the high-voltage devices and the low-voltage devices are adopted in a circuit structure, the consumption area of chips is greatly reduced, the chip manufacture cost is effectivelyreduced, and the requirements of users are met.
Description
technical field [0001] The invention relates to an integrated circuit, in particular to an overvoltage comparator circuit. Background technique [0002] In the prior art, it is necessary to detect whether a high-voltage signal in the high-voltage circuit is greater than the power supply voltage, that is, the structural diagram of a commonly used overvoltage comparison circuit is as follows: figure 1 As shown, the overvoltage comparison circuit includes a first resistor R1 and a second resistor R2 connected in series, and also includes a comparator CMP connected in parallel to both ends of the second resistor R2. dd +V th , V th for supply voltages in excess of V dd When the reference value) (not shown in the figure), the voltage VD obtained after the high-voltage signal HV Signal is divided by the first resistor R1 and the second resistor R2 and another reference level (such as a bandgap reference) are input to the comparator CMP is compared, and finally the test result ...
Claims
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Application Information
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