A kind of preparation method of binary alternately doped BST film
A technology of alternating doping and thin films, applied in the fields of nanostructure manufacturing, nanotechnology, nanotechnology, etc., can solve the problems of expensive equipment, disparity in the composition of thin films and targets, and high cost, so as to improve the comprehensive dielectric tuning performance, improve the The effect of interface matching relationship
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Embodiment 1
[0045] Embodiment 1 prepares Si / SiO 2 Six layers of 1mol% Mn and 1mol% Y alternately doped BST films on / Ti / Pt substrate.
[0046] According to technical scheme described in the present invention in Si / SiO 2 / Ti / Pt substrate prepared six layers of 1mol% Mn and 1mol% Y alternately doped BST thin films, such as figure 2 shown. Wherein, the doping concentration of Mn or Y refers to the percentage doping concentration relative to the molar weight of barium strontium in the BST sol (all the following examples are the same); Odd layers are doped with Mn and pre-crystallized, and even layers are doped with Y and pre-crystallized. crystallize.
[0047] The prepared BST thin film such as figure 2 , where: (a) is a schematic diagram of the film structure, (b) is the AFM morphology of the film, (c) and (d) correspond to the capacitance and dielectric loss of the film at 100kHz, respectively, (e) and (f) Corresponding to capacitance and dielectric loss at 1MHz, respectively.
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Embodiment 2
[0049] Embodiment 2 prepares Si / SiO 2 Six layers of 1mol% Y and 1mol% Mn alternately doped BST films on / Ti / Pt substrate.
[0050] According to technical scheme described in the present invention in Si / SiO 2 Six layers of 1mol% Y and 1mol% Mn alternately doped BST thin films prepared on / Ti / Pt substrate, such as image 3 shown. The odd-numbered layers are doped with Y and pre-crystallized, and the even-numbered layers are doped with Mn and pre-crystallized.
[0051] The prepared BST thin film such as image 3 , where: (a) is a schematic diagram of the film structure, (b) is the AFM morphology of the film, (c) and (d) correspond to the capacitance and dielectric loss of the film at 100kHz, respectively, (e) and (f) Corresponding to capacitance and dielectric loss at 1MHz, respectively.
[0052] Depend on image 3 It can be seen that the surface of the BST film is smooth, dense, and free of cracks, but the grain boundaries are clearer, and the average size of nanocrystal g...
Embodiment 3
[0053] Embodiment 3 prepares Si / SiO 2 Six layers of 1.5mol% Mn and 1.5mol% Y alternately doped BST films on / Ti / Pt substrate.
[0054] According to technical scheme described in the present invention in Si / SiO 2 Six layers of 1.5mol% Mn and 1.5mol% Y alternately doped BST thin films prepared on / Ti / Pt substrate, such as Figure 4 shown. The odd-numbered layers are doped with Mn and pre-crystallized, and the even-numbered layers are doped with Y and pre-crystallized.
[0055] The prepared BST thin film such as Figure 4 , where: (a) is a schematic diagram of the film structure, (b) is the AFM morphology of the film, (c) and (d) correspond to the capacitance and dielectric loss of the film at 100kHz, respectively, (e) and (f) Corresponding to capacitance and dielectric loss at 1MHz, respectively.
[0056] Depend on Figure 4 It can be seen that the surface of the BST thin film is smooth, dense and free of cracks, and the average grain size is about 50nm. At 100kHz: the ca...
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