SPARC processor single particle effect detection device and method

Abstract

The invention relates to a detecting device and a detecting method for the single event effect of a SPARC processor; the detecting device comprises a testing circuit board, a high-speed data collect and control unit, a main control computer and a dual-way power-supply system; through dual-thread control, the testing circuit board and the main control computer can realize simultaneous monitoring for single event latch and other single event effects; the testing circuit can be flexibly provided with a tested processor and a monitoring processor to carry out self-test and dual-processor supporting test; the hardware structure of the device can suit to all kinds of the single event effects of the SPARC processor; the device can realize the different testing for all kinds of the single event effects, and can solve the problem of measuring the single event effects of the SPARC processor in the environment of ground simulative radiation.

Description

technical field [0001] The invention relates to a detection device and method for the single event effect of a SPARC processor, which is mainly used for evaluating the sensitivity of the single event effect of the processor by an experimental method, and can provide microprocessors with anti-single event effects for aerospace, military and civilian use Ability to evaluate and measure methods. Background technique [0002] Microelectronic or optoelectronic devices used in space systems such as satellites must work in an extremely dangerous radiation environment. High-energy particles from space, the sun and the earth's capture belt will hit sensitive nodes on the device, causing permanent damage or transient damage. Events, a single high-energy particle impacting a device to generate a trajectory-related phenomenon of ionized charge is commonly referred to as a single-event effect (English: Single-event effects; abbreviated as: SEE) which can cause temporary or permanent chan...

AI Technical Summary

Problems solved by technology

The test method is single, the test program must be written into the program memory of the monitoring processor before the test, the adaptability of the hardware device to the test software is poor, and the update and reload of the online test software cannot be performed. The combination of test device hardware Lack of flexibility (i.e. different configurations of hardware structures)

Patent application number 200410083647.1, the applicant is the Space Science and Applied Research Center of the Chinese Academy of Sciences, the patent name "a detector and method for detecting the ability of a microprocessor to resist single event events" is an invention patent for an on-planet single particle test device, mainly Complete the acquisition of single event faults in typical applications, there is no method to test the single event of each functional module of the processor, in terms of hardware configuration, because it is a star product, the composition is fixed, and it does not have the ability to be flexible and configurable

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