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Sub-wavelength continuous surface micro-structure preparation method based on negative refractive rate lens

A negative refractive index and sub-wavelength technology, which is applied in the field of sub-wavelength continuous surface microstructure preparation, can solve the problem that the processing range is difficult to expand to the sub-wavelength scale.

Inactive Publication Date: 2008-02-13
INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0004] The technical problem to be solved in the present invention is to provide a method for preparing a sub-wavelength continuous surface microstructure based on a negative refractive index lens in view of the fact that the processing range of the existing continuous surface microstructure preparation technology is difficult to expand to the sub-wavelength scale , the method realizes the subwavelength continuous surface structure forming

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Embodiment Construction

[0027] The present invention will be described in detail below in conjunction with specific embodiments, but the scope of protection of the present invention is not limited to the following examples, and should include all content in the claims.

[0028] In the specific embodiment of the present invention, only the metal silver layer is taken as an example. The main similarities between the metal gold layer and the metal silver layer are both used as negative refractive index lenses. identical. In addition, the various materials used as the spacer layer and gap layer, whether they are organic materials or inorganic materials, have exactly the same functions, and the process operation steps are also exactly the same. Therefore, the present invention only provides an embodiment, and other implementation modes are completely the same as the embodiment.

[0029] The specific implementation steps of the present invention are as follows:

[0030] (1) For the target structure of qu...

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Abstract

A preparation method of sub-wavelength continuous surface microstructure based on negative refractive index lens: (1) quantify and decompose the target structure, and make a half-tone photolithography mask with graphic feature size on the order of nanometers; (2) The surface of the sheet is coated with photoresist, and then a spacer layer is coated on the surface of the photoresist substrate, and then a metal layer with a thickness of about 10nm-120nm is evaporated on the surface of the spacer layer; (3) a spacer layer is coated on the surface of the metal layer, The prepared halftone photolithographic mask is tightly pressed on the surface of the gap layer; (4) the incident light is vertically irradiated on the surface of the halftone mask to realize the exposure of the photoresist; (5) after the exposure is completed, the gap layer and the metal layer, and develop the photoresist to obtain the desired continuous planar structure. The invention realizes the preparation of the sub-wavelength continuous surface structure, and can be widely used in the preparation of various new functional devices based on surface plasmons.

Description

technical field [0001] The invention belongs to the technical field of micro-nano structure processing, in particular to a method for preparing a sub-wavelength continuous surface microstructure based on a negative refractive index lens. Background technique [0002] In recent years, with the rapid development of micro-nano processing technology and nanomaterials, the electromagnetic properties of micro-nano metal structures are receiving more and more attention. The interaction of light with surface micro-nano metal structures produces a series of new and exotic physical phenomena. For example, in 1998, French scientist Ebbesen and his collaborators discovered the phenomenon of extraordinary enhancement (Extraordinary Optical Transmission) of light passing through a subwavelength metal hole array. The research of H.J.Lezec et al. further showed that: when the light passes through the sub-wavelength metal nanohole, its transmittance can not only be enhanced, but also the di...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G03F7/00G03F1/00G03F1/32
Inventor 罗先刚杜春雷董小春邓启凌
Owner INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
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