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Double-fin type channel double-grid multifunction field effect transistor and producing method thereof

A field effect transistor and multifunctional technology, applied in the field of metal oxide semiconductor field effect transistors, can solve problems affecting the DC characteristics and reliability of devices, long programming/erasing time, affecting device reliability, etc., to improve programming/erasing Erasing speed, improvement of DC characteristics and reliability, effect of improving reliability

Active Publication Date: 2009-08-12
SEMICON MFG INT (SHANGHAI) CORP +1
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] However, the SOONO structure MOSFET multifunctional device shown in Document 1 is based on a planar double-gate device, and has the following problems: (1) The back gate ONO stack structure is too thick due to the device structure and manufacturing process (respectively 1.4nm, 42nm, 1.4nm, the total thickness reaches about 45nm), which makes the threshold window small (2.5V), the back gate voltage during programming / erasing is higher (up to 6V / -4V), and the programming / erasing time is longer (up to 0.5 ms / 0.5ms), the application of a thin tunnel oxide layer (1.4nm) makes the retention characteristics worse, and the too thick silicon nitride trap layer makes the redistribution of injected charges affect the reliability of the device; (2) compared with conventional MOSFETs The preparation method needs to add two layouts: a Stripe version (remove the SiGe sacrificial layer), a deep trench isolation layout, used to isolate different back gates; (3) the back gate completely covers the channel and source and drain, in Band-band tunneling hot holes during erasing will be injected into the coverage area of ​​the back gate and drain, affecting the DC characteristics and reliability of the device
(4) The SiGe layer as the sacrificial layer and the silicon layer as the channel are both epitaxially grown, and the process cost is relatively high

Method used

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  • Double-fin type channel double-grid multifunction field effect transistor and producing method thereof
  • Double-fin type channel double-grid multifunction field effect transistor and producing method thereof
  • Double-fin type channel double-grid multifunction field effect transistor and producing method thereof

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Embodiment Construction

[0064] The dual-fin channel dual-gate multifunctional field effect transistor provided by the present invention and its preparation method will be described in detail below in conjunction with the accompanying drawings, but this does not constitute a limitation to the present invention.

[0065] like image 3 Shown in (a)-(c) are the double-fin-type channel double-gate multifunctional field effect transistor of this embodiment. The device is based on a bulk silicon substrate. like image 3 (a) shows the layout of the device, M1 memory version, M2 active area version, M3 gate version, and the dark position is the double fin channel. like image 3 (b) and (c) are the cross-sectional structures of the device along the vertical direction of the channel (A1A2 direction) and along the channel direction (B1B2 direction), respectively. From the cross-sectional structure along the vertical direction of the channel, the field effect transistor is based on a bulk silicon substrate 30...

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Abstract

The invention provides a double-fin type channel double-gate multifunctional field effect transistor and a preparation method thereof, which belong to the technical field of metal oxide semiconductor field effect transistors in VLSI. The field effect transistor is based on a bulk silicon substrate; the channel is two identical fin-shaped fins with rectangular cross-sections, forming a double-fin-shaped channel; the outer side of each fin-shaped channel is a gate oxide and a front gate, and the inner side is a Tunneling oxide layer, silicon nitride trap layer, blocking oxide layer and back gate to form a double gate structure; both ends of the double fin channel are connected to a common n+ source and n+ drain, the front gate and back gate are self-aligned, The coverage of n+ source and n+ drain is very small; there is a thick silicon dioxide insulating layer between the double-fin channel and the bulk silicon substrate, and the n+ source and n+ drain are connected to the bulk silicon substrate to form The double-fin channel is the structure of the body on the insulating layer. The invention has the functions of high-performance MOSFET logic device, flash memory and non-capacitive DRAM.

Description

technical field [0001] The invention belongs to the technical field of metal oxide semiconductor field effect transistors (MetalOxide Semiconductor Field Effect Transistor—MOSFET) in ultra-large-scale integrated circuits (ULSI), in particular to a double-fin-type channel double-gate multifunctional field-effect transistor and its preparation method. Background technique [0002] With the wide application and high-speed development of VLSI, based on MOSFET, System On Chip (SOC) technology has aroused people's great interest more and more. The system chip is to integrate the whole system on one or as few integrated circuit chips as possible, and each chip can integrate two or more functions from the original single function. SOC technology can overcome various problems in board-level integration of multi-chips (such as delay between chips, reliability of printed circuit boards), and has outstanding advantages in improving system performance, reducing power consumption, and ea...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L29/78H01L29/423H01L21/336H01L21/28
Inventor 周发龙吴大可黄如王润声张兴王阳元
Owner SEMICON MFG INT (SHANGHAI) CORP
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