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Holder for Use in Semiconductor or Liquid-Crystal Manufacturing Device and Semiconductor or Liquid-Crystal Manufacturing Device in Which the Holder Is Installed

a technology of semiconductor or liquid crystal, which is applied in the direction of heat exchange arrangement, circuit-breaking switch, and semiconductor/solid-state device details, etc., can solve the problems of high thermal conductivity, poor throughput, and thick retard heat-up and cool-down speed, etc., to achieve superior thermal shock resistance, good throughput, and the effect of almost nil generation of contaminants and particulates

Inactive Publication Date: 2007-05-03
SUMITOMO ELECTRIC IND LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0011] The present invention has been brought about to resolve the foregoing issues. That is, an object of the present invention is to make available a holder for use in semiconductor or liquid-crystal manufacturing devices, as well as semiconductor or liquid-crystal manufacturing devices in which the holder is installed, with which temperature uniformity in the surface of semiconductor wafers or LCD glass is enhanced and generation of contaminants and particulates is minimal, and in which resistance to thermal shock is superior, costs are lowered and production efficiency is excellent.
[0014] A holder as described above advantageously is installed in semiconductor or liquid-crystal manufacturing devices. In such semiconductor or liquid-crystal manufacturing devices, inasmuch as the surface temperature of the wafers and LCD glass that are the processed objects proves to be more uniform than with conventional holders made of ceramic, and at the same time resistance to thermal shock is superior and generation of contaminants and particulates is almost nil, high-quality semiconductor or liquid crystal display devices can be manufactured with good throughput.

Problems solved by technology

With ceramics that are insulative those that have high thermal conductivity are limited, however.
Another problem has been that to improve the temperature uniformity of ceramics generally used in susceptors, such as Al2O3, AlN, Si3N4, and SiC, the susceptors should be made thick, but making them thick retards the heat-up and cool-down speeds, meaning that since throughput cannot be raised productivity suffers.
A further problem is that because ceramics are materials that either have an extremely high melting point, or that do not have a melting point, melting and casting ceramics or heating and roll-milling cast ceramic blocks in the way metals are presents difficulties.
Consequently, to make ceramic susceptors thicker, and to enlarge them diametrically to over 200 mm has entailed a quantum leap in cost.
And a further difficulty has been that because these ceramics are fragile materials they break when subject to localized heat stress.
Apart from temperature uniformity as just discussed, another issue has been that in carrying out the different processes mentioned earlier, the generation of contaminants and particulate debris from metallic impurities has to be restrained to the utmost because of the seriously negative impact that the contaminants and particulates would have on the quality of the semiconductors and liquid crystals that are fabricated.

Method used

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  • Holder for Use in Semiconductor or Liquid-Crystal Manufacturing Device and Semiconductor or Liquid-Crystal Manufacturing Device in Which the Holder Is Installed
  • Holder for Use in Semiconductor or Liquid-Crystal Manufacturing Device and Semiconductor or Liquid-Crystal Manufacturing Device in Which the Holder Is Installed
  • Holder for Use in Semiconductor or Liquid-Crystal Manufacturing Device and Semiconductor or Liquid-Crystal Manufacturing Device in Which the Holder Is Installed

Examples

Experimental program
Comparison scheme
Effect test

embodiments

Embodiment One

[0045] Commercially available ceramic-metal composites of 400 mm diameter, 10 mm thickness and made of Al—Al2O3 were readied. The processed-object retaining faces of the ceramic-metal composites were polished to finish the retaining face to a planarity of 0.03 mm and a microroughness of 0.7 μm (Ra). The water absorption ratio of the ceramic-metal composites was 0.00%. The Young's modulus, thermal expansion coefficient (α), and thermal conductivity (κ) of the composites are set forth in Table I.

[0046] In addition, ceramic susceptors made of Al2O3, AlN, and SiC were prepared. By creating a heat-generating patterned circuit made of molybdenum on each of sintered ceramic pieces, laminating a separate sintered ceramic piece onto each of those, and bonding the laminate together using a hot press, ceramic susceptors into which a resistive heating element is embedded were produced. The ceramic susceptors were finished to an outer diameter of 350 mm, and a thickness of 10 mm....

embodiment two

[0054] Apart from making the ceramic-metal composite Al—AlN, holders like those of Embodiment 1 were fabricated, and the same evaluations as in Embodiment 1 were made. The results are set forth in Table III. Here, the pump-down time was the same 5-minute interval as in Embodiment 1.

TABLE IIICeramic-metal compositeTemp.Young'sHeaterunifor-modulusακsub-mity ±CyclingNo.(GPa)(×10−6 / ° C.)(W / mK)stance(%)test72107.5176Al2O30.2082107.5176A1N0.1092107.5176SiC0.10

embodiment three

[0055] Apart from making the ceramic-metal composite Al—SiC, holders like those of Embodiment 1 were fabricated, and the same evaluations as in Embodiment 1 were made. The results are set forth in Table IV. Here, the pump-down time was the same 5-minute interval as in Embodiment 1. For comparison, furthermore, a holder in which instead of a ceramic-metal composite an isolated Al2O3 ceramic was used (No. 20), one in which an AlN ceramic was used (No. 21), and one in which an SiC ceramic was used (No. 22) were prepared, and the results of evaluating these are additionally set forth in Table IV.

TABLE IVCeramic-metal compositeTemp.Young'sHeaterunifor-modulusακsub-mity ±CyclingNo.(GPa)(×10−6 / ° C.)(W / mK)stance(%)test102006.2159Al2O30.20112006.2159A1N0.20122006.2159SiC0.10131957.1162A1N0.30141807.6163A1N0.20151758.0165A1N0.201615010.0162A1N0.251712514.4162A1N0.271810516.2164A1N0.27199517.6162A1N0.29203907.829A1N0.94213144.6165A1N0.35224104.0180A1N0.26

[0056] The following will be understo...

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Abstract

Affords a holder for use in semiconductor or liquid-crystal manufacturing devices—as well as semiconductor or liquid-crystal manufacturing devices in which the holder is installed—in which temperature uniformity in the processed-object retaining face is heightened. Configuring the holder with, furnished atop a ceramic susceptor, a composite of a ceramic and a metal improves the temperature uniformity in the holder's processed-object retaining face and makes for curtailing the generation of particulates and other contaminants. In addition, putting a coating on at least the retaining face improves the durability of the holder. Installing a holder of this sort in a semiconductor manufacturing device or a liquid-crystal manufacturing device contributes to making available semiconductor or liquid-crystal manufacturing devices whose productivity and throughput are excellent.

Description

BACKGROUND OF INVENTION FIELD OF THE INVENTION [0001] The present invention relates to holders employed in semiconductor manufacturing devices or in liquid-crystal manufacturing devices—such as equipment for plasma CVD, low-pressure CVD, metal CVD, dielectric CVD, ion-implantation, etching, low-k deposition, and degassing—and furthermore to semiconductor or liquid-crystal manufacturing devices in which the holders are installed. BACKGROUND ART [0002] Conventionally, in semiconductor or liquid-crystal manufacturing procedures various processes, such as film deposition processes and etching processes, are carried out on semiconductor substrates or liquid-crystal containing glass plates (LCD glass) that are the processed objects. Ceramic susceptors, which are both for retaining semi-conductor substrates or LCD glass, and for heating semi-conductor substrates or LCD glass, are used in the processing devices in which such processes on semiconductor substrates or LCD glass are carried out...

Claims

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Application Information

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IPC IPC(8): C23C16/00H05B3/03C23C16/458H01L21/02H01L21/687H05B3/12H05B3/14H05B3/74
CPCC23C16/4581C23C16/4586H01L21/68757H01L21/68785H05B3/12H05B3/143
Inventor HASHIKURA, MANABUNAKATA, HIROHIKOKUIBIRA, AKIRANATSUHARA, MASUHIRO
Owner SUMITOMO ELECTRIC IND LTD
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