Silicon through hole barrier layer alkaline polishing solution
A technology of polishing liquid and through-silicon vias, which is applied to polishing compositions containing abrasives, electrical components, circuits, etc., can solve problems such as lower yield, high biological toxicity, and scratches on the wafer surface, and achieve improved surface consistency The effect of improving the removal rate and reducing the removal rate
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Embodiment 1
[0026] The content of the polishing liquid in this example is in mass percent: glycine, 0.5%; arginine, 2%; 1,2,4-triazole, 0.05%; sodium carboxymethylcellulose, 0.1%; 100nm particle size silica sol 20%.
[0027] Corresponding experimental data: hydrogen peroxide: 0.25%; pH: 8.5; polishing conditions: up and down throwing head speed: 78 / 83rpm; polishing fluid flow rate: 300ml / min; polishing pressure: 1.5psi; copper removal rate: 180A / min, tantalum removal rate It is 850A / min, and the roughness Sq of the tantalum film is 1.7nm. The rate selectivity ratio of tantalum to copper is close to 5:1. The depth of the copper dish at the TSV is 167A.
Embodiment 2
[0029] The content of the polishing liquid in this embodiment is in mass percent: glycine, 0.5%; arginine, 5%; 1,2,4-triazole, 0.05%; sodium carboxymethylcellulose, 0.1%. Corresponding experimental data: Polishing conditions: hydrogen peroxide: 0.25%; pH: 8.5; rotating speed of up and down throwing head: 78 / 83rpm; polishing fluid flow rate: 300ml / min; polishing pressure: 1.5psi; copper removal rate is 212A / min, tantalum removal rate It is 1024A / min, and the roughness Sq of the tantalum film is 0.8nm. The rate selectivity ratio of tantalum to copper is close to 5:1. The depth of the copper dish at the TSV is 185A.
Embodiment 3
[0031] The content of the polishing liquid in this embodiment is in mass percent: glycine, 0.5%; arginine, 3%; 1,2,4-triazole, 0.1%; sodium carboxymethylcellulose, 0.1%. Hydrogen peroxide: 0.25%; pH: 9.
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