Method and device for optimizing photoetching process, and computer storage medium
A lithography process and photoresist technology, which is applied in the field of lithography process, can solve the problems affecting the development progress of lithography process, investing a lot of manpower and material resources, etc., so as to avoid experiments and attempts, reduce research and development costs, and have a wide range of applications Effect
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[0042] A method and device for optimizing a photolithography process, and a computer storage medium provided by the present invention will be explained and illustrated in detail below in conjunction with the accompanying drawings.
[0043] like figure 1 As shown, one or more embodiments of the present invention can provide a method for optimizing a photolithography process, which may include but not limited to one or more of the following steps.
[0044] Firstly, data of the target photoresist is acquired; the data of the target photoresist may include but not limited to photoresist spatial data and photoresist composition data. The target photoresist involved in the present invention can be a chemically amplified photoresist, and of course it can also be a traditional photoresist.
[0045] Secondly, the present invention can divide the space occupied by the target photoresist according to the photoresist space data to determine multiple unit blocks. Wherein, grid points are...
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